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Thin film growth atomic force microscopy

Kanniainen, T. Lindroos, S. Prohaska, T. Friedbacher, G Leskela, M. Grasserbauer, M. Niinisto, L. 1995. Growth of zinc sulfide thin films with the successive ionic layer adsorption and reaction method as studied by atomic force microscopy./. Mater. Chem. 5 985-9. [Pg.271]

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See also in sourсe #XX -- [ Pg.37 , Pg.38 ]



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