Technique selection, corrosion surface analysis

The purpose of this section is to show, by example, how the concerns of technique selection, potential problems, data acquisition and analysis have been applied for several different corrosion problems and techniques. Examples of fundamental research work and industrial problem solving have been included to show the range of applicability of the techniques. In most cases, more than one technique was used to solve the problem. Frequently, a surface analysis technique was used in combination with one or more other types of analysis method. These examples are not comprehensive it is hoped that sufficient references have been supplied to enable the reader to find other work of relevant interest. 

Abstract Surface analyses have been one of the key technologies for corrosion control and surface finishing. It is very important that the most appropriate apparatus for the purpose of the analyses should be selected from various analytical techniques. In this chapter, surface analytical methods for corrosion control and surface finishing, such as X-ray fluorescence analysis (XRF), X-ray diffraction analysis (XRD), X-ray photo-electron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), Rutherford back-scattering spectrometry (RBS), Surface-enhanced Raman spectroscopy (SERS), Fourier-transform infrared spectroscopy (FTIR), and so on, are briefly introduced. 

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