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Surface SEM micrographs

Figure 16.4 Surface SEM micrograph of microporous stretched LLDPE/60% CaCOs film [21]. Figure 16.4 Surface SEM micrograph of microporous stretched LLDPE/60% CaCOs film [21].
Additional details of the structure of semicrystalline polymers can be determined on such selectively etched surfaces. SEM micrographs in Figure 3.9 show the two main types of isotactic polypropylene (PP) Micrograph (a) shows the most common a-modification with the so-called cross-hatched... [Pg.41]

Mo and Ca are detected on the wear scar surface. SEM micrographs show the smooth topographical nature of the wear scar and the lack of any gross deformation of the surface. This indicates a protective layer on the surface of the material between the contacting areas. [Pg.758]

Figure 1.5b Fiber surfaces. SEM micrographs of (a) sugarcane bagasse ... Figure 1.5b Fiber surfaces. SEM micrographs of (a) sugarcane bagasse ...
Surface SEM micrograph of 3105 aluminium alloy anodised in oxalic media (a) with polyaniline and (b) polyaniline and TI02 nanoparticles. In (b), the agglomeration of Ti02 nanoparticles is indicated with number 1 and some examples are marked with circles... [Pg.137]

As an example, consider again the back surface of the silicon wafer used in the mechanical profiler example. Eigure 4a, an SEM micrograph taken at 45° tilt, shows a surface covered with various sized square-shaped features that often overlap. This information cannot be discerned from the mechanical profiler trace, but can be obtained using a 3D optical profiler measurement. Eigures 4b and 4c are also... [Pg.701]

Figure 4 SEM micrographs of a region on the back of a silicon wafer (a) and (b) show the surface at different magnifications ic) is a cross sectional view (Courtesy of P. M. Kahora, AT T Bell Laboratories). Figure 4 SEM micrographs of a region on the back of a silicon wafer (a) and (b) show the surface at different magnifications ic) is a cross sectional view (Courtesy of P. M. Kahora, AT T Bell Laboratories).
The structure of CBCF is shown in the SEM micrograph in Fig. 4. The crenellated surface of the rayon derived carbon fibers is clearly visible, as is the phenolic derived carbon binder. The preferred orientation of the fibers (resulting from the slurry molding operation) is obvious in Fig. 4, and imparts considerable anisotropy to the material. The molding direction is perpendicular to the plane of the carbon fibers in Fig. 4. [Pg.174]

Fig. 17. High-resolulion stereo SEM micrograph of CAA oxide (a) with FPL prelrealmenl (b) with PAA prelrealmenl (c) production CAA surface, (a) and (b) are from Ref. [9]. Fig. 17. High-resolulion stereo SEM micrograph of CAA oxide (a) with FPL prelrealmenl (b) with PAA prelrealmenl (c) production CAA surface, (a) and (b) are from Ref. [9].
Figure 6 shows SEM micrographs of the fracture surface after tensile test. For the immiscible Ultem/Vec-tra B blends, numerous microfibrils are observed to be pulled out from the surface (Fig. 6A), Many matrix voids generated by the pull-out of microfibrils reveal the poor... Figure 6 shows SEM micrographs of the fracture surface after tensile test. For the immiscible Ultem/Vec-tra B blends, numerous microfibrils are observed to be pulled out from the surface (Fig. 6A), Many matrix voids generated by the pull-out of microfibrils reveal the poor...
Fig. 34—(a) Representative SEM micrograph, (b) surface profiles of the scratch tracks, and (c) the evolutions of normal load and friction force between the tip and the film of the DLC film deposited at -90 V bias. [Pg.26]

Fig. 1. Optical image and SEM micrographs of a single cell (a) the SDC electrolyte surface view (b) LSM-SDC-NiSDC cross view. Fig. 1. Optical image and SEM micrographs of a single cell (a) the SDC electrolyte surface view (b) LSM-SDC-NiSDC cross view.
Fig. 4.3 SEM micrograph of the rear side of an n-(lOO) Si wafer polished on one side. The presence of inverted truncated square pyramidal stmctures fuUy covering the surface can be observed. This pyramidal texturing was attributed to the combination of anisotropic etching of the sdicon and to hydrogen bubbles evolved during the etching reaction. (Reprinted from [23] Copyright 2009, with permission from Elsevier)... Fig. 4.3 SEM micrograph of the rear side of an n-(lOO) Si wafer polished on one side. The presence of inverted truncated square pyramidal stmctures fuUy covering the surface can be observed. This pyramidal texturing was attributed to the combination of anisotropic etching of the sdicon and to hydrogen bubbles evolved during the etching reaction. (Reprinted from [23] Copyright 2009, with permission from Elsevier)...
Fig. 4.14 SEM micrograph of CVD nickel-coated carbon microfibers (INCOEIBER 12K20) before (a) and after (b) the cathodic electrosynthesis of ZnSe on their surfaces (the scale bar is 8 and 10 p.m, respectively). Such low-dimensional substrates find apphcation in new-generation photovoltaic solar cells, chemical/biological sensors, and light-emitting devices. (Reprinted from [127], Copyright 2009, with permission from Elsevier)... Fig. 4.14 SEM micrograph of CVD nickel-coated carbon microfibers (INCOEIBER 12K20) before (a) and after (b) the cathodic electrosynthesis of ZnSe on their surfaces (the scale bar is 8 and 10 p.m, respectively). Such low-dimensional substrates find apphcation in new-generation photovoltaic solar cells, chemical/biological sensors, and light-emitting devices. (Reprinted from [127], Copyright 2009, with permission from Elsevier)...
Figure 4. SEM micrographs of the silicalite-alumina composite material A cross-section of the tube. B and C magnifications of the inner surface of the tube and of the first a-AI2O3 layer. Figure 4. SEM micrographs of the silicalite-alumina composite material A cross-section of the tube. B and C magnifications of the inner surface of the tube and of the first a-AI2O3 layer.
To look for small voids, SEM was used. For the cracked sample, a fracture surface was examined, while a cut surface of the good sample was studied. This test showed large differences between the two samples with the cracked part showing significant voids. Figure 43(a) shows an SEM micrograph for the good... [Pg.647]

SEM micrographs of two members of these polymers (HB and HBIB-50) are shown in Figure 7 to provide further evidence for superstructure on the micron level within the solution cast films. One can directly observe the surface of the spherulitic structure of the HB homopolymer as well as in that of the copolymer HBIB-50. Clearly, the level of structure (-5 pm) is well above that of the individual domains of either HB or HI and reflects the possible primary nucleation and subsequent growth behavior common to spherulitic semicrystalline polymers. The Hv patterns shown in... [Pg.131]

Fig. 12.13 SEM micrographs and EDX spectra of the SGA-Ca surface before and after soaking in SBF. The EDX spectra clearly show the evolution of the inorganic chemical composition on the surface from silicon and calcium oxide to a calcium phosphate. Fig. 12.13 SEM micrographs and EDX spectra of the SGA-Ca surface before and after soaking in SBF. The EDX spectra clearly show the evolution of the inorganic chemical composition on the surface from silicon and calcium oxide to a calcium phosphate.
Nitrogen adsorption was performed at -196 °C in a Micromeritics ASAP 2010 volumetric instrument. The samples were outgassed at 80 °C prior to the adsorption measurement until a 3.10 3 Torr static vacuum was reached. The surface area was calculated by the Brunauer-Emmett-Teller (BET) method. Micropore volume and external surface area were evaluated by the alpha-S method using a standard isotherm measured on Aerosil 200 fumed silica [8]. Powder X-ray diffraction (XRD) patterns of samples dried at 80 °C were collected at room temperature on a Broker AXS D-8 diffractometer with Cu Ka radiation. Thermogravimetric analysis was carried out in air flow with heating rate 10 °C min"1 up to 900 °C in a Netzsch TG 209 C thermal balance. SEM micrographs were recorded on a Hitachi S4500 microscope. [Pg.390]

Figure 1. SEM micrograph of a hole excavated in the surface of an anorthite crystal by the primary ion beam during approximately 4 h of isotopic analysis. The scale bar is 5 pm in length. Figure 1. SEM micrograph of a hole excavated in the surface of an anorthite crystal by the primary ion beam during approximately 4 h of isotopic analysis. The scale bar is 5 pm in length.
Figure 3.16 shows typical SEM micrographs of the YSZ electrolyte surface in contact with an LSM cathode in the presence of a Fe-Cr ally at 900°C after cathodic polarization at 200 mAcnr2 for different periods [185], The LSM electrode coating... [Pg.163]


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SEM micrograph

SEM micrographs

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