Subtractively normalized interfacial Fourier-transform infrared reflection

It is only since 1980 that in situ spectroscopic techniques have been developed to obtain identification of the adsorbed intermediates and hence of reliable reaction mechanisms. These new infrared spectroscopic in situ techniques, such as electrochemically modulated infrared reflectance spectroscopy (EMIRS), which uses a dispersive spectrometer, Fourier transform infrared reflectance spectroscopy, or a subtractively normalized interfacial Fourier transform infrared reflectance spectroscopy (SNIFTIRS), have provided definitive proof for the presence of strongly adsorbed species (mainly adsorbed carbon monoxide) acting as catalytic poisons. " " Even though this chapter is not devoted to the description of in situ infrared techniques, it is useful to briefly note the advantages and limitations of such spectroscopic methods. [Pg.76]

In situ IR spectra were recorded using, either the Single Potential Alteration Iirfrared Reflectance Spectroscopy (SPAIRS), also called Linear Potential Sweep-Fourier Transform Infrared Reflectance Spectroscopy (LPS-FTIRS), or the Subtractively Normalized Interfacial Fourier Transform Infrared Reflectance Spectroscopy (SNIFTIRS). ... [Pg.400]

In situ subtractively normalized interfacial Fourier transform infrared reflectance spectroelectrochemistry (SNIFTIRS) studies confirm this prediction [37]. They also... [Pg.699]

Pons [133] reported a slightly more sophisticated data acquisition protocol, which he termed SNIFTIRS (subtractively normalized interfacial Fourier transform infrared spectroscopy), which involved stepping the potential of the reflective working electrode repeatedly between two preset values, as shown in Fig. 11(d). The... [Pg.550]

Table 17.15 shows results obtained from the application of various bulk and surface analysis methods to lithium metal at rest or after cyclization experiments, as well as at noble metal and carbon electrodes after cathodic polarization. Several surface and elemental analysis methods are applied, including X-ray photoelectron spectroscopy (XPS, ESCA/XPS), energy dispersive analysis of X-rays (X-ray microanalysis, EDAX), Eourier transform infrared spectroscopy (ETIR), Auger electron spectroscopy (AES), ellipsometry (E), electro-modulated infrared reflectance spectroscopy (EMIRS), double modulation Fourier transform infrared spectroscopy (DMFTIR), subtractively normalized interfacial Fourier transform infrared spectroscopy (SNIFTIRS), gas chromatography (GC), IR spectroscopy. X-ray diffraction (XRD), and atomic force microscopy (AFM). [Pg.579]