Subject transmission electron

To illustrate the effect of radial release interactions on the structure/ property relationships in shock-loaded materials, experiments were conducted on copper shock loaded using several shock-recovery designs that yielded differences in es but all having been subjected to a 10 GPa, 1 fis pulse duration, shock process [13]. Compression specimens were sectioned from these soft recovery samples to measure the reload yield behavior, and examined in the transmission electron microscope (TEM) to study the substructure evolution. The substructure and yield strength of the bulk shock-loaded copper samples were found to depend on the amount of e, in the shock-recovered sample at a constant peak pressure and pulse duration. In Fig. 6.8 the quasi-static reload yield strength of the 10 GPa shock-loaded copper is observed to increase with increasing residual sample strain. 

Fig. 13.9 Transmission electron microscopic data ofendocytosis. Saos-2 cell was treated with LDH and after 1 h the cell was fixed and subjected to TEM measurement. (A) successive internalization of LDH via endocytosis access of LDH around plasma membrane, formation of membrane ruffles and interaction...

Substrate Characterization. Test coupons and panels of 7075-T6 aluminum, an alloy used extensively for aircraft structures, were degreased In a commercial alkaline cleaning solution and rinsed In distilled, deionized water. The samples were then subjected to either a standard Forest Products Laboratories (FPL) treatment ( 0 or to a sulfuric acid anodization (SAA) process (10% H2SO4, v/v 15V 20 min), two methods used for surface preparation of aircraft structural components. The metal surfaces were examined by scanning transmission electron microscopy (STEM) In the SEM mode and by X-ray photoelectron spectroscopy (XPS). 

Powdered, particulate MCM-41 molecular sieves (Si/Al = 37) with varied pore diameters (1.80, 2.18, 2.54 and 3.04 nm) were synthesized following the conventional procedure using sodium silicate, sodium aluminate and C TMAB (n = 12, 14, 16 and 18) as the source materials for Si, A1 and quaternary ammonium surfactants, respectively [13]. Each sample was subjected to calcination in air at 560 °C for 6 h to remove the organic templates. The structure of the synthesized material was confirmed by powder X-ray diffraction (XRD) and by scanning/transmission electron microscopy. Their average pore sizes were deduced from the adsorption curve of the N2 adsorption-desorption isotherm obtained at 77 K by means of the BJH method (Table 1). 

SEM is particularly useful for showing up the surface structure of materials by analysing the secondary electrons. Transmission electron microscopy (TEM) relies on the use of the electrons passing through the very thin samples and can show up images of the internal structure of samples. It can achieve a resolution of about 1 x 10-10 m. Both SEM and TEM require a high vacuum and so samples must be stable in vacuums and when subjected to fast moving electrons. 

The surface morphology of grains has been studied by secondary electron microscopy (SEM) (Hoppe et al., 1995). Such studies have been especially useful for pristine SiC grains that have not been subjected to any chemical treatment (Bernatowicz et al., 2003). Finally, the transmission electron microscope (TEM) played an important role in the discovery of presolar SiC (Bernatowicz et al., 1987) and internal TiC and other subgrains in graphite (Bernatowicz et al., 1991). It has also been successfully applied to the study of diamonds (Daulton et al., 1996) and of polytypes of SiC (Daulton et al., 2002, 2003). 

The case of Cryptosporidium species substantiates at best the common features examined in the precedent section. These atypical coccidians, responsible for severe chronic diarrhea in immunocompromised patients and for acute diarrhea in immunocompetent subjects (Chalmers and Davies 2009), penetrate enterocytes remaining at the microvillous surface level (Fig. 1). This situation is usually qualified as intracellular - extracytoplasmic or, more recently, epicellular (Valigurova et al. 2008), as the parasites develop at the level of the brush border of microvillus. A feeder organelle can be observed in the zone of contact with the host-cell cytoplasm using transmission electron microscopy (TEM) (Valigurova et al. 2008). 

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