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Source brightness

The brightness of the three principal sources operating at 100 kV are (in Am-2sr-1) 109 for tungsten, 5 x 1010 for LaB6, and 1013 for field emission. [Pg.134]


Inert gas beams allow the chemistry of a surface to be studied by SIMS without modification by the bombarding species. The achievable values of source brightness allow pA currents into spot diameters of approximately 50 pm for dynamic SIMS, or nA currents into spot diameters < 5 pm for imaging SIMS. For greater spatial resolution a different, higher-brightness source must be used. [Pg.74]

PHOTO- mJ cm /iJ cm J cm Wavelength (spectrum) Substrate reflectivity Mask contrast Exposure ambient Source Brightness Flash time... [Pg.167]

E-BEAM C cm /iC cm Accelerating voltage Substrate backscatter Total time in vacuum Beam size and shape Source brightness Flash (dwell) time... [Pg.167]

X-RAY mJ cm nS cm Wavelength Exposure ambient Mask absorption characteristics Source brightness Exposure time... [Pg.167]

Hardware limitations in the deep-UV region revolve around lens design (and fabrication) and source brightness. The lens problem is a materials-related issue in that the number of optical-grade materials with acceptable... [Pg.56]

Deep-UV source brightness is another issue, because the power output of a 1-kW mercury-xenon lamp in the 200-250-nm range is only 30-40 mW. For this reason, excimer lasers (such as KrCl and KrF), which can deliver several watts of power at the required wavelengths, are being considered as alternatives (7). In fact, a deep-UV step-and-repeat projection system with an all-quartz lens and a KrF excimer laser with an output at 248 nm has been reported (8). Even the laser-based systems require resists with a sensitivity of 30-70 mj/cm2. [Pg.338]

X-ray Resists. The key issues in X-ray resists are source brightness, resist sensitivity, and mask quality. The method used to generate X-rays... [Pg.356]

Fig. A.6. Absolute viscosity of sulfuric acid versus mass% H2S04 in sulfuric acid. For viscosity in kg m 1 s 1, multiply cP by 0.001. Source Bright, N.F., Hutchinson, H. and Smith, D., (1946) The viscosity and density of sulfuric acid and oleum, J. Soc. Chem. Ind. 65, 385 388. Fig. A.6. Absolute viscosity of sulfuric acid versus mass% H2S04 in sulfuric acid. For viscosity in kg m 1 s 1, multiply cP by 0.001. Source Bright, N.F., Hutchinson, H. and Smith, D., (1946) The viscosity and density of sulfuric acid and oleum, J. Soc. Chem. Ind. 65, 385 388.
Regarding the source brightness, tunable lasers are certainly an alternative for overcoming the low brightness of incoherent sources however, their higher cost can be a limiting factor for several applications. The arrival of GaN LED... [Pg.119]

Source Brightness (particles cm eV steradian ) Elastic Mean 1 Free Path (A) Absorption Length (A) Minimum Probe Size (A)... [Pg.362]

The expression linking the source brightness ( ), the probe current (/), the diameter of the probe (d) and the beam convergence semi-angle at the sample (a) ... [Pg.139]

Thermionic source brightnesses are about 10 A sr maximum current several microamperes. [Pg.44]

Field emission source brightnesses are about 10 ° A m sr maximum current 0.1 pA. [Pg.44]

The XSW technique is not exclusively a synchrotron-based technique it can be performed with use of a conventional fixed-tube X-ray source or rotating anode. However, several practical considerations make it far more advantageous, and often essential, to perform these experiments at a synchrotron source. Some of these considerations are generally true for any X-ray experiment, while others are specific to the XSW techniques. These considerations are often of great practical importance in carrying out XSW experiments. We briefly discuss some of these factors, which include X-ray source brightness, tunability, and polarization. [Pg.238]

However, in order to exttact the source brightness the wv-plane should be fully sampled, which is not the case. In practice, one has a sampled version of V (u, v). By performing the inverse Fourier tfansform of the sampled complex visibility function one obtains the dirty image or dirty map... [Pg.35]

The Double Fourier Modulation technique is the combination of Fourier Transform Spectroscopy with Stellar Interferometry for a given interferometric baseline, one performs an FTS scan. With this technique measurements of the source brightness distribution and spectrum are performed simultaneously. [Pg.39]

The electron gun should provide a source brightness as high as possible and the energy spread in the emitted beam should be as low as possible. The two principal aberrations of concern in a SEM are spherical and chromatic aberration, and they should be as low as possible. [Pg.545]

The relationship between direct glare discomfort and the factors affecting it, viz. source brightness (Bs), background brightness (Bb), apparent size of the source angle (co), and an index (p) representing the position of the source in relation to the direction of vision, is as follows ... [Pg.458]


See other pages where Source brightness is mentioned: [Pg.77]    [Pg.127]    [Pg.134]    [Pg.144]    [Pg.67]    [Pg.148]    [Pg.150]    [Pg.57]    [Pg.18]    [Pg.58]    [Pg.68]    [Pg.81]    [Pg.138]    [Pg.6023]    [Pg.436]    [Pg.111]    [Pg.114]    [Pg.345]    [Pg.65]    [Pg.6022]    [Pg.39]    [Pg.143]    [Pg.177]    [Pg.565]    [Pg.42]    [Pg.623]   
See also in sourсe #XX -- [ Pg.26 ]




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