Solid-liquid interface, scanning electrochemical transfer

This chapter is concerned with the study of interfacial processes and reactions that occur essentially at electrically insulating interfaces, where the role of the SECM tip is often to induce and monitor the reaction of interest. The work herein is an update of Chapter 12 Probing reactions at solid/liquid interfaces of the first edition of Scanning Electrochemical Microscopy [4] and highlights how the basic principles of the SECM-induced transfer (SECMIT) mode (or equilibrium perturbation mode) and related techniques— notably (multi-) potential step transient methods—can be applied to a wide variety of interfaces where flux measurements have traditionally been difficult. 

Michael V. Mirkin is professor of chemistry at Queens College, City University of New York, New York City, New York. His professional interests are in the application of electrochemical methods to solving problans in physical and analytical chemistry and include charge-transfer reactions at solid-liquid and liquid-liquid interfaces, electrochemical kinetics, and nanoelectrochemistry. He has published more than 110 peer-reviewed papers and book chapters and coedited the first monograph on scanning electrochanical microscopy (second edition, 2012). He earned a PhD in electrochemistry (1987) from Kazakh State University (former USSR) and did postdoctoral research at The University of Texas at Austin from 1990 to 1993. 

FIGURE 5.5 Simulated SECM current vs. distance curves for a pure (A) positive and (B) negative feedbaek and different RG values. Symbols, simulation solid line in (A), Equation 5.30 solid line in (B), Equation 5.31. (A) RG=(1) 10 and (2) 1.1. (B) RG=(1) 1.1, (2) 2, and (3) 10. (Reprinted from Shao, Y. and Mirkin, M.V., Probing ion transfer at the liquid/liquid interface by scanning electrochemical microscopy (SECM), J. Phys. Chem. B, 102, 9915-9921,1998. Copyright 1998 American Chemical Society.)... 

---