Secondary electron microscope wavelength

Notes TIMS, thermal ionization mass spectrometry ICP-MS, inductively coupled plasma mass spectrometry GD-MS, glow discharge mass spectrometry XRF, x-ray fluorescence XRD, x-ray diffraction GC-MS, gas chromatography-mass spectrometry SEM, scanning electron microscope TEM, transmission electron microscope SIMS, secondary ion mass spectrometry EDS, energy-dispersive sensor WDS, wavelength-dispersive sensor. 

Compared to conventional electron or light microscopes, scanning electron microscope pictures exhibit remarkable three-dimensional effects due to the extraordinary depth of field made possible by the wavelength and apertures involved (Figure 11). Depth of field is 1 cm at 100 X and 1 /rm at 10,000 x. The scanning microscope is superior to the transmission microscope because it records secondary electrons from the surface rather than primary transmitted electrons. Thin samples are therefore unnecessary and the depth of focus gives the topography directly. 

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