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Scattering, backscattering

ISS Ion scattering spectroscopy [153, 154] Inelastic backscattering of ions (-1 keV ion beam) Surface composition... [Pg.315]

Figure Al.7.12 shows the scattered electron kinetic energy distribution produced when a monoenergetic electron beam is incident on an A1 surface. Some of the electrons are elastically backscattered with essentially... Figure Al.7.12 shows the scattered electron kinetic energy distribution produced when a monoenergetic electron beam is incident on an A1 surface. Some of the electrons are elastically backscattered with essentially...
Taglauer E 1997 Low-energy Ion scattering and Rutherford backscattering Surface Analysis The Principal Techniques ed J C VIckerman (Chichester Wiley) pp 215-66... [Pg.1827]

B1.24 Rutherford backscattering, resonance scattering, PIXE and forward (recoil) scattering... [Pg.1827]

Rutherford backscattering spectrometry is the measurement of the energies of ions scattered back from the surface and the outer microns (1 micron = 1 pm) of a sample. Typically, helium ions with energies around 2 MeV are used and the sample is a metal coated silicon wafer that has been ion implanted with about a... [Pg.1827]

This overview covers the major teclnhques used in materials analysis with MeV ion beams Rutherford backscattering, chaimelling, resonance scattering, forward recoil scattering, PIXE and microbeams. We have not covered nuclear reaction analysis (NRA), because it applies to special incident-ion-target-atom combinations and is a topic of its own [1, 2]. [Pg.1829]

Figure Bl.24.1. Schematic diagram of the target chamber and detectors used in ion beam analysis. The backscattering detector is mounted close to the incident beam and the forward scattering detector is mounted so that, when the target is tilted, hydrogen recoils can be detected at angles of about 30° from the beam direction. The x-ray detector faces the sample and receives x-rays emitted from the sample. Figure Bl.24.1. Schematic diagram of the target chamber and detectors used in ion beam analysis. The backscattering detector is mounted close to the incident beam and the forward scattering detector is mounted so that, when the target is tilted, hydrogen recoils can be detected at angles of about 30° from the beam direction. The x-ray detector faces the sample and receives x-rays emitted from the sample.
Figure Bl.24.13. A thin film of LaCaMn03 on an LaA103 substrate is characterized for oxygen content with 3.05 MeV helium ions. The sharp peak in the backscattering signal at chaimel 160 is due to the resonance in the scattering cross section for oxygen. The solid line is a simulation that includes the resonance scattering cross section and was obtained with RUMP [3]. Data from E B Nyeanchi, National Accelerator Centre, Fame, South Africa. Figure Bl.24.13. A thin film of LaCaMn03 on an LaA103 substrate is characterized for oxygen content with 3.05 MeV helium ions. The sharp peak in the backscattering signal at chaimel 160 is due to the resonance in the scattering cross section for oxygen. The solid line is a simulation that includes the resonance scattering cross section and was obtained with RUMP [3]. Data from E B Nyeanchi, National Accelerator Centre, Fame, South Africa.
See other pages where Scattering, backscattering is mentioned: [Pg.72]    [Pg.2050]    [Pg.218]    [Pg.31]    [Pg.72]    [Pg.2050]    [Pg.218]    [Pg.31]    [Pg.866]    [Pg.868]    [Pg.306]    [Pg.309]    [Pg.310]    [Pg.1628]    [Pg.1631]    [Pg.1823]    [Pg.1828]    [Pg.1828]    [Pg.1828]    [Pg.1829]    [Pg.1831]    [Pg.1835]    [Pg.1838]    [Pg.2749]    [Pg.2754]    [Pg.330]    [Pg.269]    [Pg.269]    [Pg.270]    [Pg.281]    [Pg.162]    [Pg.200]    [Pg.210]    [Pg.213]    [Pg.3]    [Pg.36]    [Pg.72]    [Pg.73]    [Pg.151]    [Pg.184]    [Pg.228]    [Pg.331]    [Pg.364]    [Pg.434]    [Pg.473]    [Pg.474]   
See also in sourсe #XX -- [ Pg.82 ]



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Backscatter

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