Scanning tunneling microscopic characterization

The development of scanning probe microscopies and x-ray reflectivity (see Chapter VIII) has allowed molecular-level characterization of the structure of the electrode surface after electrochemical reactions [145]. In particular, the important role of adsorbates in determining the state of an electrode surface is illustrated by scanning tunneling microscopic (STM) images of gold (III) surfaces in the presence and absence of chloride ions [153]. Electrodeposition of one metal on another can also be measured via x-ray diffraction [154]. 

The experiments were performed in a combined system for UHV and electrochemical measurements. It consists of a UHV system equipped with standard facilities for surface preparation and characterization and a pocket-size scanning tunneling microscope (STM) [Kopatzki, 1994], a pre-chamber containing a flow cell for electrochemical measurements, which was attached to the main UHV system via a gate valve, and... 

Spectroscopic and spatial characterization of superconducting vortex core states with a scanning tunneling microscope. J. Vac. Sci. Technol. A 8, 450-454. H. F., Robinson, R. B., and Waszczak, J. V. (1990a). Vortex-core structure observed with a scanning tunneling microscope Phys. Rev. Lett. 64, 2711-2714. 

Poirier GE, Hance BK, White JM (1998) Scanning tunneling microscopic and auger-electron spectroscopic characterization of a model catalyst - rhodium on TiO fOOl). J Phys Chem 97 5965... 

A model P4-18-SPM scanning tunneling microscope (NT-MDT, Russia) was employed to investigate the structure, in atmosphere, of nanometer-scale thin film materials and also to measure the thickness of the film. A setup [28] combining electrochemical studies and X-ray photoelectron spectroscopic (XPS) analysis served to characterize the surface composition of alloy films. 

Xue K, Xu JB, Xi L, An J, Chen J. In Situ fabrication and characterization of tungsten nanodots on Si02/Si via field induced nanocontact with a scanning tunnelling microscope. Nanotechnology 2005 16 2993-3000. 

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