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Scanning probe microscopy tribology

The potential applications of inorganic nanotubes as tips for scanning probe microscopy for the study of soft tissue rough surfaces and for nanolithography is further discussed in this chapter (Section VI). Most importantly, these kinds of nanoparticles exhibit interesting tribological properties, which are briefly discussed. [Pg.273]

Scanning Probe microscopy techniques are extremely useful for analysing surfaces, but cannot lead to bulk information. They will be used each time surface properties are important, i.e. when surfaces are used for themselves (tribological applications, adhesion, etc.). However, in some cases, the study of transport phenomena (such as thermal or electrical conductivity) by modified AFM may lead to bulk characterisation such as the formation of a percolating nanotube network for instance. [Pg.76]

The application of scanning probe microscopy in industrial research is expected to have at minimum one very important dividend knowledge of abrasion and friction applicable to the field of tribology. This study, known as nanotribology, may provide the knowledge required to minimize, and in some cases eliminate, the effects of friction and abrasion. [Pg.1644]

The processes of friction are much more complicated than this simple view, however. Since the development of the current atomic theory and quantum mechanics, it is now known that many other effects play a role in the causes of friction. Researchers in tribological phenomena are only now beginning to acquire an understanding of details of the process at the atomic level, where tribology begins. This new understanding has been made possible by the development of scanning probe microscopy and, particularly, of the atomic force microscope. [Pg.1866]

Field emission scanning electron microscopy (FESEM), glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), micro Raman scattering, Fourier transform inftaied (FTIR) spectrometry, Rutherford back scattering (RBS) studies and electron probe micro analysis (EPMA) have been carried out to obtain micro-structural and compositional properties of the diamond/p-SiC nanocomposite films. Atomic force microscopy (AFM) and indentation studies have been carried out to obtain film properties on the tribological and mechanical front. [Pg.372]


See other pages where Scanning probe microscopy tribology is mentioned: [Pg.1865]    [Pg.5074]    [Pg.190]    [Pg.216]    [Pg.455]    [Pg.712]    [Pg.741]    [Pg.101]    [Pg.475]   
See also in sourсe #XX -- [ Pg.1866 , Pg.1868 , Pg.1869 ]




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