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Scanning photoelectrochemical microscopy

Scanning electrochemical microscopy (SECM) - Direct mode - Feedback mode - Generation/collection mode Scanning reference electrode technique (SRET) Scanning vibrating electrode technique (SVET) Scanning photoelectrochemical microscopy (SPECM) Scanning electrochemical induced desorption (SECMID)... [Pg.596]

Rincdn, M.E., Trujillo. M.E., Avalos, J., and Casillas, N. 2007. Photoelectrochemical processes at interfaces of nanostructured TiOj/carbon black composites studied by scanning photoelectrochemical microscopy. Journal of Solid State Electrochemistry 11,1287-1294. [Pg.297]

SECM and related methodologies, such as scanning photoelectrochemical microscopy (SPECM) (16,17), are ideally suited to investigating the phenomena underpinning corrosion processes. This is because (1) they are... [Pg.573]

CasiUas, N., James, P. and Smyrl, W.H. (1995) A novel-approach to combine scanning electrochemical microscopy and scanning photoelectrochemical microscopy. Journal of the Electrochemical Society, 142, L16—L18. [Pg.242]

PEC measurements were also carried out with a modified optical fiber in an SECM, sometimes called scanning photoelectrochemical microscopy (SPECM) (Chapter 17). This was used to look at the photogeneration of Br2 on irradiated Ti02, with a main interest in studying corrosion films on metals. The most recent thrust of SECM in PEC studies has been in comparative studies of the effect of modifications of photocatalysts prepared as arrays and screened with the SECM, which is discussed in the following sections. [Pg.543]

Semiconducting thin films of CdSe were electrochemically deposited on Ti substrates [186,187]. The film electrodes were characterized with photoelectrochemical imaging, optical microscopy, and scanning electron microscopy (SEM)/energy-dispersive X-ray analysis. [Pg.781]

Summary. The importance of flie electrode surface structure in electrochemistry is briefly described. Examples are given in which the structural information provided by scanning tunneling microscopy (STM) is of assistance in clarifying the electrochemical behavior. The importance of surface structure in the photoelectrochemical response of metals is illustrated by an STM application. Finally, the potentialities of newr scanning microprobe techniques suitable for mapping local photoelectrochemical properties of metal surfaces are briefly discussed. [Pg.101]

Williams, D.E., Mohiuddin, T.F and Zhu, Y.Y. (1998) Elucidation of a trigger mechanism for pitting corrosion of stainless steels using submicron resolution scanning electrochemical and photoelectrochemical microscopy. Journal of the Electrochemical Society, 145, 2664— 2672. [Pg.219]

Liu, W., Ye, H.C. and Bard, A.J. (2010) Screening of novel metal oxide photocatalysts by scanning electrochemical microscopy and research of their photoelectrochemical properties. Journal of Physical Chemistry C, 114, 1201-1207. [Pg.242]

Zhao, X. K. McCormick, L. Fendler, J. H. 1991. Electrical and photoelectrochemical characterization of CdS particulate films by scanning electrochemical microscopy, scanning tunneling microscopy, and scanning tunneling spectroscopy. Chem. Mater. 3 922—935. [Pg.744]

James, R, Casillas, N., Smyrl, W. Simultaneous scanning electrochemical and photoelectrochemical microscopy by use of a metallized optical fiber, J. Electrochem. Soc. 1996, 143, 3853-3865. [Pg.73]

Shen, Y., Nonomura, K., Schlettwein, D., Zhao, C., Wittstock, G. Photoelectrochemical kinetics of eosin Y-sensitized zinc oxide films investigated by scanning electrochemical microscopy. Chem. Eur. J. 2006, 12, 5832-5839. [Pg.564]

Jang, J.S., Lee, J., Ye, H., Fan, F.-R.R, Bard, A.J. Rapid screening of effective dopants for FejOj photocatalysts with scanning electrochemical microscopy and investigation of their photoelectrochemical properties./. Phys. Chem. C2009, 113(16), 6719-6724. [Pg.564]

Liu, G., Bard, A.J. Rapid preparation and photoelectrochemical screening of CulnSej and CulnMSej arrays by scanning electrochemical microscopy. J. Phys. Chem. C 2010,114,17509-17513. [Pg.565]

A probe consisting of an optical fiber coated with gold was used as the SECM tip to image simultaneously the electrochemical and photoelectrochemical activity of pitting precursor sites on an oxide film (11b, 115) by combining SECM with scanning photo-electrochemical microscopy (116). It was found that the area of high electrochemical activity is correlated with lower substrate photocurrent in the area. [Pg.519]


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