Scanning near-field optical microscopy SNOM

Durig U T, Pohl D W and Rohner F 1986 Near-field optical-scanning microscopy J. Appl. Phys. 59 3318 Pohl D W 1991 Scanning near-field optical microscopy (SNOM)/Icfr/. Opt. Electron. Microsc. 12 243... 

More recently, the method of scanning near-field optical microscopy (SNOM) has been applied to LB films of phospholipids and has revealed submicron-domain structures [55-59]. The method involves scanning a fiber-optic tip over a surface in much the same way an AFM tip is scanned over a surface. In principle, other optical experiments could be combined with the SNOM, snch as resonance energy transfer, time-resolved flnorescence, and surface plasmon resonance. It is likely that spectroscopic investigation of snbmicron domains in LB films nsing these principles will be pnrsned extensively. 

Scanning Near-field Optical Microscopy (SNOM)... 

Mechanistic investigations of gas-solid and solid-solid reactions as well as their proper engineering require identifiable crystal surfaces for atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) [1,3, 13-15] in combination with X-ray diffraction data, which are the basis of crystal packing analyses [1,3,16-18]. 

Scanning near-field optical microscopy (SNOM) or near-field scanning optical microscopy (NSOM) Shear force microscopy (ShFM) Aperture SNOM (ASNOM) - Transmission ASNOM (T-ASNOM)... 

Fig. 34. dPS volume fraction (J)dPS vs depth z for a 50/50 dPS/PBrxS mixture after annealing for different times at T=180 °C as revealed by TOF-FRES a tA=10 min, b tA=160 min, c tA= 6175 min). In the bottom part, a sketch of the domain structure is shown as revealed from the ion beam and scanning near field optical microscopy (SNOM) results (shaded areas dPS-rich domains white areas dPS-poor domains). From Straub et al. [153]... 

Among the various techniques, we shall only discuss STM, scanning force microscopy (SFM or AFM), and scanning near-field optical microscopy (SNOM or NSOM), as those can well be considered the most prominent members of the SPM family. Among the three, we shall further focus on SFM, as most of the work done on polymers has indeed made use of this method. However, a brief note on STM and SNOM seems appropriate. 

The aim of the present paper is to outline several important general properties of SVD basic functions that are relevant for resolution estimation and enhancement in near-field problems, including scanning near-field optical microscopy (SNOM). 

Pohl DW, Fischer UC, Durig UT. Scanning near-field optical microscopy (SNOM). J Microsc (Oxf) 1988 152 853-861. 

Scanning Near-Field Optical Microscopy (SNOM) Aperture SNOM (ASNOM) Collection ASNOM (C-ASNOM) Emission ASNOM (E-ASNOM) Evanescent Field SNOM (EF-SNOM) Nonaperture ASNOM (NA-SNOM) Shear Force Microscopy Transmission Mode (TSNOM) Reflection Mode Luminescence Mode... 

Deeper insight can be gained from a scanning near-field optical microscopy (SNOM) study by McNeill et al., who resolved the local photocurrent obtained on MDMO-PPV PCBM toluene cast blends [138]. The authors revealed that the photocurrent was considerably reduced on top of the small hUls caused by the PCBM clusters (Fig. 25), whereas it stayed nearly constant over the surface of chlorobenzene cast blends [ 138]. 

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