Scanning force microscope SFM

A scanning force microscope (SFM) has proven to be an instrument that can image biomedical systems at high resolution (in the nanometer scale) and obtain time-dependent dynamic information about their surface morphology in various (air, liquid, vacuum) environments [1,2],... 

Fig. 19 Experimental set-up for thermal noise analysis experiments. The dynamic information is contained in the random motion of a sphere which is in contact with the brush and suspended on the cantilever of a scanning-force microscope (SFM)...

SAW) is performed with a sensitivity in the sub-picometer range. Acoustic waves are generated as well as detected with microprobes in a microscopic hybrid system consisting of a scanning electron microscope (SEM) combined with a scanning force microscope (SFM). 

Figure 6 Scanning Force Microscopic (SFM) image of PFS-6-PDMS diblock copolymer cylinders deposited along a prepattemed groove on a resist film, followed by liftoff with acetone followed by hydrogen plasma treatment the aligned nanoscopic line, height 4nm, is composed of clusters of Fe, Si, O, and C (adapted from Ref. 43).

In this study, the layered structure of the organotiichlorosilane monolayer with a vinyl end group was constructed by the Langmuir method and its structure was analyzed by X-ray reflectivity (XR), Brewster angle Fourier transform infrared (B-FT-IR) spectroscopic measurements (14), electron diffraction (ED) and scanning force microscopic (SFM) observations. Furthermore, the domain height of the (NTS/FOETS) mixed monolayer surface with phase-separated structure was controlled by the combined method of Langmuir and chemisorption methods. 

Nanometer-scale contacts to compliant linear viscoelastic materials can be studied experimentally with the scanning force microscope (SFM). Creep significantly modifies the formation and rupture of these contacts compared to contacts to elastic materials. Not only does the maximum contact area depend on the loading history but, unlike elastic materials, it reaches its maximum value well after the maximum load is applied. Effects due to creep are distinct firom those induced at the periphery of the contact by adhesion. Creep effects dominate adhesion effects in SFM-scale contacts for a wide range of compliant viscoelastic materials. Strategies are presented to optimize experimental parameters for creep studies in SFM-scale contacts to linear viscoelastic materials. 

Scanning Tunneling Microscopy (STM), Scanning Force Microscope (SFM), Scanning Probe Microscope (SPM), and Atomic Force Microscopy (AFM)... 

Atomic force microscope (AFM) (characterization) A stylus surface profilometer that measures the deflection of a probe mounted on a cantilever beam. The AFM can be operated in three modes contact, non-contact, and tapping. Also called the scanning force microscope (SFM). 

---