Scanning electron microscopy films

Scanning Electron Microscopy. Films were observed by scanning electron microscopy (JEOL SM 840A) with an accelerating voltage of 2.5 kV samples were previously cut with a scalpel and gilded. 

A first approximate approach for estimating N,pb, or /tpb.n is to use scanning electron microscopy to estimate the average grain size, d, of the electrode. One then assumes spherical grains for the electrode film and semispherical grains in contact with the solid electrolyte to obtain ... 

In the same year, Fulda and Tieke [75] reported on Langmuir films of monodisperse, 0.5-pm spherical polymer particles with hydrophobic polystyrene cores and hydrophilic shells containing polyacrylic acid or polyacrylamide. Measurement of ir-A curves and scanning electron microscopy (SEM) were used to determine the structure of the monolayers. In subsequent work, Fulda et al. [76] studied a variety of particles with different hydrophilic shells for their ability to form Langmuir films. Fulda and Tieke [77] investigated the influence of subphase conditions (pH, ionic strength) on monolayer formation of cationic and anionic particles as well as the structure of films made from bidisperse mixtures of anionic latex particles. 

A Dektak siuface profilometer was used to measure the etch rates. The profiles of the etched films were observed by field emission scanning electron microscopy (FESEM). In addition, x-ray photoelectron spectroscopy PCPS) was utilized to examine the existence of possible etch products or redeposited materials, and to elucidate the etch mechanism of Co2MnSi magnetic films in a CVOa/Ar plasma. 

The films were characterized using x-ray powder diffraction (XRD), x-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The photoelectron spectroscopy utilized a Vacuum Generators ESCA Lab II system with Mg(Ka) radiation. Binding energies (BE) were measured with respect to the surface C(ls) peak (284.5 eV) which was always present In these films. Scanning electron microscopy was done with a JEOL JSM-35C system. 

Figure 2.4 A scanning electron microscopy image of an AFM cantilever tip covered with a thin silver film.

Figure 2.8. Scanning electron microscopy (SEM) photomicrographs of (a) a micro-diffractive optical element mold fabricated by a focused ion beam (FIB) and (b) the transferred optical element on a sol-gel film. [Reprinted with permission from Ref. 98.]... 

Figure 9.5. Mesoporous Ti02 films templated by the KLE block copolymer, (a) Scanning electron microscopy (T = 600 °C, i.e., above the crystallization temperature) and (b) Krypton physisorption of films heat-treated at 570 °C (filled circles) and 650 °C (triangles). It is seen that the porosity of films, prepared by the advanced block copolymer template, is still intact even after treatment at temperatures that convert the amorphous Ti02 matrix into the crystalline (anatase) one. The films were prepared based on the recipe in Ref. 80.

Core-shell colloidal crystal films were prepared in three steps as outlined in Table 4.2. First, spherical submicron polystyrene particles were prepared by known methods38 39. The size of isolated polystyrene beads was 326 5 nm as determined by analysis of scanning electron microscopy (SEM) images using standard techniques. 

Figure 4.7 Scanning electron microscopy images of TMOS and 50 50 C8-TEOS-TMOS xerogel films. (Reproduced from ref. 7, with permission.)...

Scanning electron microscopy (SEM) used to investigate the structure of similar organically modified silicate (ORMOSIL) films shows that certain [Ru(dpp)3]2+-doped octyl-triethylorthosilicate (triEOS)-tetra-ethylorthosilicate (TEOS) composites form uniform, crack-free xerogel films (Figure 6.6) that can be used to construct high-sensitivity oxygen... 

Scanning electron microscopy confirmed sub-0.5p.m resolution capabilities in TBSS -acid generator resist films (Figure 3). Note that the edge profiles are nearly vertical. Preliminary results indicate that the plasma etching resistance is satisfactory for semiconductor device processing. 

We first experimented with the Quartz Crystal Microbalance (QCM) in order to measure the ablation rate in 1987 (12). The only technique used before was the stylus profilometer which revealed enough accuracy for etch rate of the order of 0.1 pm, but was unable to probe the region of the ablation threshold where the etch rate is expressed in a few A/pulse. Polymer surfaces are easily damaged by the probe tip and the meaning of these measurements are often questionable. Scanning electron microscopy (21) and more recently interferometry (22) were also used. The principle of the QCM was demonstrated in 1957 by Sauerbrey (22) and the technique was developed in thin film chemistiy. analytical and physical chemistry (24). The equipment used in this work is described in previous publications (25). When connected to an appropriate oscillating circuit, the basic vibration frequency (FQ) of the crystal is 5 MHz. When a film covers one of the electrodes, a negative shift <5F, proportional to its mass, is induced ... 

Atomic force microscopy (AFM) is a commonly employed imaging technique for the characterization of the topography of material surfaces. In contrast to other microscopy techniques (e.g., scanning electron microscopy), AFM provides additional quantitative surface depth information and therefore yields a 3D profile of the material surface. AFM is routinely applied for the nanoscale surface characterization of materials and has been previously applied to determine surface heterogeneity of alkylsilane thin films prepared on planar surfaces [74,75,138]. 

Scanning electron microscopy photographs of the dendritic Pt film (a) before the reduction treatment and (b) after the reduction treatment. (Reproduced from Yamada, K. et al. ]oumal of Power Sources 2008 180 181-184. With permission from Elsevier.)... 

Image analysis has been used to characterize the pore structure of synthetic membrane materials. The Celgard films have also been characterized by scanning tunneling microscopy, atomic force microscopy, and field emission scanning electron microscopy. The pore size of the Celgard membranes can also be calculated from eq 5, once the MacMullin number and gurley values are known. 

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