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Scanning electron microscopy examination

Blackson, J., Garcia-Meitin, E., and Darus, M., High Resolution Scanning Electron Microscopy Examination of Polymer Morphology, Microscopy and Microanalysis, 13 (Suppl. 02), 1062 (2007)... [Pg.538]

A diffusion-based mechanism has been found when polyacid-modified composite specimens were stored in a lactate buffer [36], and to apply for up to 169 h. Scanning electron microscopy examination of the specimens at the end of the fluoride release... [Pg.78]

The explanted devices were also examined by scanning electron microscopy and the results shown in Fig. 21 (18). The pictures clearly show a progressive diminution of a central uneroded zone and the development of voids around the periphery of the rod-shaped device. The presence of voids suggest that once erosion starts, generation of hydrophilic degradation products at that location accelerates further polymer hydrolysis. [Pg.144]

A Dektak siuface profilometer was used to measure the etch rates. The profiles of the etched films were observed by field emission scanning electron microscopy (FESEM). In addition, x-ray photoelectron spectroscopy PCPS) was utilized to examine the existence of possible etch products or redeposited materials, and to elucidate the etch mechanism of Co2MnSi magnetic films in a CVOa/Ar plasma. [Pg.378]

Scanning electron microscopy shows the cement to consist of zinc oxide particles embedded in an amorphous matrix (Smith, 1982a). As with the zinc phosphate cement, a separate globular water phase exists since the cement becomes uniformly porous on dehydration. Porosity diminishes as the water content is decreased. Wilson, Paddon Crisp (1979) distinguish between two types of water in dental cements non-evaporable (tightly bound) and evaporable (loosely bound). They found, in the example they examined, that the ratio of tightly bound to loosely bound water was 0-22 1-0, the lowest for all dental cements. They considered that loosely bound water acted as a plasticizer and weakened the cement. [Pg.106]

This technique can be applied to samples prepared for study by scanning electron microscopy (SEM). When subject to impact by electrons, atoms emit characteristic X-ray line spectra, which are almost completely independent of the physical or chemical state of the specimen (Reed, 1973). To analyse samples, they are prepared as required for SEM, that is they are mounted on an appropriate holder, sputter coated to provide an electrically conductive surface, generally using gold, and then examined under high vacuum. The electron beam is focussed to impinge upon a selected spot on the surface of the specimen and the resulting X-ray spectrum is analysed. [Pg.369]

Structural changes on the whey proteins from the effect of extrusion cooking were examined by scanning electron microscopy and TEM. Changes in the microstructure of WPI (Pig. 5.3) show the transition from... [Pg.182]

Particle morphology can be examined with optical microscopy and scanning electron microscopy. A discussion of both techniques is presented. [Pg.130]

Following early ETEM investigations using environmental cells, environmental scanning electron microscopy (ESEM) has been developed for characterization of surface effects of bulk SEM samples in the presence of gaseous or wet environments (111-114). The method has been applied to the examination of food, wool fibers (111), and polymers (112) and in the conservation of cultural properties (113). Recently, fuel cell catalysts have been characterized using a low-voltage ESEM with a resolution capability of 2 nm (114). [Pg.234]

Microscopic techniques, 70 428 Microscopists, role of, 76 467 Microscopy, 76 464-509, See also Atomic force microscopy (AFM) Electron microscopy Light microscopy Microscopes Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) acronyms related to, 76 506-507 atomic force, 76 499-501 atom probe, 76 503 cathodoluminescence, 76 484 confocal, 76 483-484 electron, 76 487-495 in examining trace evidence, 72 99 field emission, 76 503 field ion, 76 503 fluorescence, 76 483 near-held scanning optical,... [Pg.586]

Bishop, J.H., Silva, S.R. The examination of the structure of antifouling coatings by scanning electron microscopy. JOCCA, 52 (1969) 201-218. [Pg.234]

Scanning electron microscopy (SEM) is also used to examine separator morphology. SEM pictures of some commercial membranes are shown in Figures... [Pg.192]


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See also in sourсe #XX -- [ Pg.305 , Pg.307 ]




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