Sample Laser line deflection

Fig. 7. Setup for the degenerate four wave mixing experiments. The input beam is split in three beams. The beam splitter BS3 deflects a part of one of the pump beams to a power meter, which detects laser power fluctuations. The delay line with the retro reflector R adjusts the temporal overlap of the two pump beams coming from the front side on the sample. The long delay line with retro reflector R2 is moved to probe the temporal behavior of the nonlinearity in the sample. The phase conjugated signal beam propagates from the sample back to BSj and is then deflected through a stack of attenuation filters on a second power meter. An iris in front of the power meter increases the signal to noise ratio by removing scattered light...

Recently, the research laboratories of the microchip producer AMD began to use TERS for characterizing patterned silicon surfaces. Metallized AFM tips that have been prepared by sputter deposition of thin Ag films onto quartz tips and sharpened by focused ion beam (FIB) miUmg were used. With a top-illumination set-up, line profiles of patterned samples were recorded and the influence of laser deflection at the tip and laser heating on silicon stress measurements were studied [44-46]. 

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