Reflection of Radiation at Planar Interface Covered by Single Layer

The Fresnel coefficients of reflection at the interface when the input medium is homogeneous, nonabsorbing, and isotropic and the final medium is homogeneous, nonabsorbing, and anisotropic, with the axes of symmetry normal and parallel to the interface, have been derived by Drude [72]. 

REFLECTION OF RADIATION AT PLANAR INTERFACE COVERED BY SINGLE LAYER 

Anisotropy in the optical properties of a layer complicates the analytical expressions for reflectance since the complex dielectric function and the refractive index of the layer become tensors (1.1.2°). Determination of a film s anisotropy from its spectrum provides a wealth of information about the structure and molecular orientation in ultrathin films and therefore is of great importance in various areas of science and technology (Section 3.11). The theoretical approaches of Schopper [112] and Kuzmin et al. [113] (see the review in Ref. [114]) are 

ABSORPTION AND REFLECTION OF INFRARED RADIATION BY ULTRATHIN FILMS 

If an isotropic layer with a thickness d.2 is located at the planar interface of two semi-infinite media (Fig. 1.12), the incident wave gives rise to reflected and refracted waves in all the media except for the ontput halfspace, where only the refracted wave exists. For such an optical configuration, the Fresnel coefficients (1.4.5°) can be rewritten in the Drude (exact) form [9] as 

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