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Reflection Cones

The half-angles of the reflection cones are 7t/2 — 0 0)- The common equation of the cone Equation (8) takes the form for the reflection cone  [Pg.198]

The coefficients of the reflection conic in the receiving slit plane are  [Pg.198]

3 Intersection of the Diffraction and Reflection Conics in the Receiving Slit Plane [Pg.199]

There are four solutions in the general case of an interseetion of two conics. In our case there are not more than two possible solutions. This oeeurs because the diffraetion and reflection cones have the same vertex-point A2. Let us denote by the angle between the axes of the diffraction and reflection cones. These eones will intersect with one another [Pg.199]

Taking into account that for points on the receiving slit plane X = x,y,0 and expressing the scalar product by the sum of the eomponent products we can obtain the relation between v and y  [Pg.199]


The diffractometer is a more complex apparatus than a powder camera and therefore more subject to misalignment of its component parts. A further difficulty with most commercial diffractometers is the impossibility of observing the same back-reflected cone of radiation on both sides of the incident beam. Thus, the experimenter has no automatic check on the accuracy of the angular scale of the instrument or the precision of its alignment. [Pg.359]

The other way to calculate the registered intensity after the plane monochromator can be described as follows. To calculate angle between two planes we need only know the unit direction vector m = m, m2,mi to the points Pcmi- These direction vectors are determined by the line of the intersection of the diffraction and reflection cones. To find this direction we use the following equations ... [Pg.200]

With the shift of the point A2 in the equatorial direction, the point Ar in the receiving slit corresponding to the middle point of the ring on the crystal plane moves by the value 5y = —ys sirup. The maximal shift of point A in the equatorial plane can be taken as the width of the receiving slit. As a consequence the only rays of the reflection cone from the points of the sample with a shift smaller than d / 2 sirup) go through the receiving slit. As an example... [Pg.200]

For 2nlQ mode reflectometers, an inverted CPC can be used in front of cavity radiation sources (46, 54) in order to reduce the non-Lambertian properties of such sources at larger angles. The HDR 100 hemiellipsoidal reflectometer from Surface Optics Corporation uses a reflective cone above a cavity radiation source (55). [Pg.286]

To further examine the utility of the double-reflecting cone, a hole was drilled in the side of a tablet and packed with 10 mg KCN. When scanned using a single reflecting cone, the sample fell into... [Pg.597]

DX series Close-up sensor with reflective cone for target emissivity correction ranges from -4.5 to -1-871 °C, digital readout. [Pg.128]

In general, a point group synnnetry operation is defined as a rotation or reflection of a macroscopic object such that, after the operation has been carried out, the object looks the same as it did originally. The macroscopic objects we consider here are models of molecules in their equilibrium configuration we could also consider idealized objects such as cubes, pyramids, spheres, cones, tetraliedra etc. in order to define the various possible point groups. [Pg.145]

The schlieren microscope is able to detect refractive index variations to six decimal places. Any small difference in optical path (index difference, film thickness, etc) is very precisely detected by the schlieren microscope, especially in the Dodd modification. It is, in effect, a darkfield method. The specimen is illuminated with light in a portion of the illuminating cone and that direct light is masked in the conjugate back focal plane of the objective (Fig. 3). The only light to pass through this plane is refracted, reflected, or diffracted by the specimen. [Pg.334]

For erosive wear. Rockwell or Brinell hardness is likely to show an inverse relation with carbon and low alloy steels. If they contain over about 0.55 percent carbon, they can be hardened to a high level. However, at the same or even at lower hardness, certain martensitic cast irons (HC 250 and Ni-Hard) can out perform carbon and low alloy steel considerably. For simplification, each of these alloys can be considered a mixture of hard carbide and hardened steel. The usual hardness tests tend to reflect chiefly the steel portion, indicating perhaps from 500 to 650 BHN. Even the Rockwell diamond cone indenter is too large to measure the hardness of the carbides a sharp diamond point with a light load must be used. The Vickers diamond pyramid indenter provides this, giving values around 1,100 for the iron carbide in Ni-Hard and 1,700 for the chromium carbide in HC 250. (These numbers have the same mathematical basis as the more common Brinell hardness numbers.) The microscopically revealed differences in carbide hardness accounts for the superior erosion resistance of these cast irons versus the hardened steels. [Pg.270]

Whereas smokes are often characterized by the mode of their formation, any coned suspension of particles ranging from 0.01 to about 5.0 pm can be considered a smoke. These particles, when suspended in air, reflect, scatter and absorb radiation in a complex manner. A comprehensive model of these interactions in terms of visibility under various conditions was described recently (Ref 62)... [Pg.984]

XRD on battery materials can be classified as powder dififaction, a technique developed by Peter Debye and Paul Scherrer. In powder dififaction the material consists of microscopic crystals oriented at random in all directions. If one passes a monochromatic beam of X-rays through a fiat thin powder electrode, a fraction of the particles will be oriented to satisfy the Bragg relation for a given set of planes. Another group will be oriented so that the Bragg relationship is satisfied for another set of planes, and so on. In this method, cones of reflected and transmitted radiation are produced (Fig. 27.2). X-ray diffraction patterns can be recorded by intercepting a... [Pg.471]

FIGURE 27.2 Debye-Scherrer powder method. Cones of reflected and transmitted radiation are produced. In this example the pattern is recorded with photographic film. Alternatively,... [Pg.471]


See other pages where Reflection Cones is mentioned: [Pg.161]    [Pg.198]    [Pg.198]    [Pg.199]    [Pg.39]    [Pg.597]    [Pg.598]    [Pg.161]    [Pg.198]    [Pg.198]    [Pg.199]    [Pg.39]    [Pg.597]    [Pg.598]    [Pg.204]    [Pg.662]    [Pg.1380]    [Pg.116]    [Pg.116]    [Pg.116]    [Pg.116]    [Pg.117]    [Pg.329]    [Pg.331]    [Pg.340]    [Pg.1058]    [Pg.63]    [Pg.712]    [Pg.696]    [Pg.289]    [Pg.472]    [Pg.396]    [Pg.20]    [Pg.164]    [Pg.220]    [Pg.145]    [Pg.76]    [Pg.81]    [Pg.236]    [Pg.290]    [Pg.174]   


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