Recording atomic force microscopy images

The systems that scan the piezos and record the image are similar to those used in atomic force microscopy. 

Fig. 7.5. Atomic force microscopy (AFM) images in 3D recorded at two scan sizes of the four stages involved in the etching and chemical modification of capillaries for OTCEC.

Fig. 9 Image of a grating area of 2 gm X 2 gm recorded by atomic force microscopy. Grating depth 30 nm, period 330 nm...

Images of the surface were recorded for increasing irradiation times by atomic force microscopy (AFM). Initially, the surface was flat and only some hill-like... 

A completely different class of analytical techniques, e.g. Atomic Force Microscopy (AFM) or Scanning Tunnelling Microscopy (STM), generate images, where the pixel brightness is used to record distances. 

The PUs microstructure can be also investigated by means of atomic force microscopy (AFM). Phase images obtained via AFM, enable visual representation of the PUs microphase separated morphology. AFM records the surface topography of materials by measuring attractive or repulsive forces between the probe and the sample. Vertical deflections caused by surface variations are monitored as a raster scan drugs a fine tip over the sample. A detailed description of different modes in AFM technology has been described in [195]. 

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