Real space, surface structure

Fig. 2 The real-space surface structures and corresponding reciprocal space lattices for ...

LEED optics were used to characterize surface structures. The principle of low energy electron diffraction can be found in ref. 110. The LEED patterns were recorded on Polaroid 667 or 552 instant films using a Polaroid attachment for a Nikon F 35 mm camera. Because both LEED patterns and real space mesh structures of Ni(lll) and Ag(lll) surfaces are well known, the substrate LEED spots were used as references co determine the unit mesh of adsorbate structures. In practice the unit vectors... 

Flamers R J, Tromp R M and Demuth J M 1986 Surface electronic structure of Si(111)-7 7 resolved in real space Phys. Rev. Lett. 56 1972... 

STM found one of its earliest applications as a tool for probing the atomic-level structure of semiconductors. In 1983, the 7x7 reconstructed surface of Si(l 11) was observed for the first time [17] in real space all previous observations had been carried out using diffraction methods, the 7x7 structure having, in fact, only been hypothesized. By capitalizing on the spectroscopic capabilities of the technique it was also proven [18] that STM could be used to probe the electronic structure of this surface (figure B1.19.3). 

The major role of TOF-SARS and SARIS is as surface structure analysis teclmiques which are capable of probing the positions of all elements with an accuracy of <0.1 A. They are sensitive to short-range order, i.e. individual interatomic spacings that are <10 A. They provide a direct measure of the interatomic distances in the first and subsurface layers and a measure of surface periodicity in real space. One of its most important applications is the direct determination of hydrogen adsorption sites by recoiling spectrometry [12, 4T ]. Most other surface structure teclmiques do not detect hydrogen, with the possible exception of He atom scattering and vibrational spectroscopy. 

In the real space the correlation function (6) exhibits exponentially damped oscillations, and the structure is characterized by two lengths the period of the oscillations A, related to the size of oil and water domains, and the correlation length In the microemulsion > A and the water-rich and oil-rich domains are correlated, hence the water-water structure factor assumes a maximum for k = k 7 0. When the concentration of surfac-... 

Soon after the invention of the STM as a tool for imaging surfaces in real space, it was discovered that the microscope could also be used (or misused) for surface manipulations, that is, for nano structuring of surfaces [5]. The extremely close vicinity of the STM tip and the sample surface required by the tunnel process... 

The late 1980s saw the introduction into electrochemistry of a major new technique, scanning tunnelling microscopy (STM), which allows real-space (atomic) imaging of the structural and electronic properties of both bare and adsorbate-covered surfaces. The technique had originally been exploited at the gas/so id interface, but it was later realised that it could be employed in liquids. As a result, it has rapidly found application in electrochemistry. 

From the computational point of view the Fourier space approach requires less variables to minimize for, but the speed of calculations is significantly decreased by the evaluation of trigonometric function, which is computationally expensive. However, the minimization in the Fourier space does not lead to the structures shown in Figs. 10-12. They have been obtained only in the real-space minimization. Most probably the landscape of the local minima of F as a function of the Fourier amplitudes A,- is completely different from the landscape of F as a function of the field real space. In other words, the basin of attraction of the local minima representing surfaces of complex topology is much larger in the latter case. As far as the minima corresponding to the simple surfaces are concerned (P, D, G etc.), both methods lead to the same results [21-23,119]. 

Conventional HRTEM operates at ambient temperature in high vacuum and directly images the local structure of a catalyst at the atomic level, in real space. In HRTEM, as-prepared catalyst powders can be used without additional sample preparation. The method does not normally require special treatment of thin catalyst samples. In HRTEM, very thin samples can be treated as WPOs, whereby the image intensity can be correlated with the projected electrostatic potential of the crystal, leading to the atomic structural information characterizing the sample. Furthermore, the detection of electron-stimulated XRE in the EM permits simultaneous determination of the chemical composition of the catalyst. Both the surface and sub-surface regions of catalysts can be investigated. 

Fig. 1. Real space and LEED structures for Ni(lOO) surfaces with ordered sulfur overlayers.

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