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Preferential sampling techniques

Positron Annihilation Lifetime Spectroscopy (PALS) provides a measure of free volume holes or voids, free volume, and free volume distribution, at an atomic scale. The technique exploits the fact that the positively charged positron (e" ), the antiparticle to the electron, preferentially samples regions of low positive charge density. When injected in a polymer matrix, thermalized positrons can combine with an electron to form a bound state, known as positronium (Ps). This species can only exist in a void and it rapidly annihilates on contact with the electron cloud of a molecule. For polymer studies using PALS, it is ortho-positronium (oPs, a triplet state) which is of interest. The oPs spin exchanges with electrons of opposite spin on the walls of the cavity and it is annihilated. Thus, the oPs lifetime, 13, gives a measure of the mean free volume cavity radius, whereas the relative intensity of... [Pg.1385]

The in-situ application of solid-state NMR requires heating and temperature control of the spinning sample. Techniques available for this purpose are reviewed in [35]. The method is applied preferentially for mechanistic rather than for active site studies, but the former often result in indirect conclusions on the sites involved in the detected reaction mechanisms [32]. [Pg.188]

Many efforts have been made to measure the size of liquid dispersed droplets. The techniques can be divided into those that require a sample to be withdrawn from the vessel (or pipe) and those that take the measurement in situ. Pulling a sample is generally considered to be acceptable if the system has been suitably stabilized using a surfactant. Significant care still needs to be taken to ensure that the resulting droplet size distribution is not affected by the sampling method itself (i.e., no droplet breakup, coalescence, or preferential sampling occurs). [Pg.190]

Chemical analysis of the metal can serve various purposes. For the determination of the metal-alloy composition, a variety of techniques has been used. In the past, wet-chemical analysis was often employed, but the significant size of the sample needed was a primary drawback. Nondestmctive, energy-dispersive x-ray fluorescence spectrometry is often used when no high precision is needed. However, this technique only allows a surface analysis, and significant surface phenomena such as preferential enrichments and depletions, which often occur in objects having a burial history, can cause serious errors. For more precise quantitative analyses samples have to be removed from below the surface to be analyzed by means of atomic absorption (82), spectrographic techniques (78,83), etc. [Pg.421]

Compensation of Preferential Sputtering. The species with the lower sputter yield is enriched at the surface. This effect is called preferential sputtering and complicates, e. g.. Auger measurements. The enrichment compensates for the different sputter yields of the compound or alloy elements thus in dynamic SIMS (and other dynamic techniques in which the signal is derived from the sputtered particles, e.g. SNMS, GD-MS, and GD-OES), the flux of sputtered atoms has the same composition as the sample. [Pg.106]

The disadvantage of lasers with nanosecond-picosecond pulse duration for depth profiling is the predominantly thermal character of the ablation process [4.229]. For metals the irradiated spot is melted and much of the material is evaporated from the melt. The melting of the sample causes modification and mixing of different layers followed by changes of phase composition during material evaporation (preferential volatilization) and bulk re-solidification [4.230] this reduces the lateral and depth resolution of LA-based techniques. [Pg.233]

This mode of chromatogram development is, in principle, almost identical with continuous development. The only feature that varies is the length of the developing path. In short bed-continuous development (SB/CD), this path is very short, typically equal to several centimeters [23-25]. This is the reason why this mode is preferentially applied for analytical separations. However, a similar technique is applied for zonal sample application and online extraction of solid samples, which are described in the following text. [Pg.142]

Ion-exchange solid-phase extractions are used for ionic compounds. The pH of the extracts is adjusted to ionize the target analytes so that they are preferentially retained by the stationary bonded phase. Selection of the bonded phase depends on the pK or pA b of the target analytes. Sample cleanup using ion exchange is highly selective and can separate polar ionic compounds that are difficult to extract by the liquid-liquid partition technique. [Pg.877]

Selection of a suitable ionisation method is important in the success of mixture analysis by MS/MS, as clearly shown by Chen and Her [23]. Ideally, only molecular ions should be produced for each of the compounds in the mixture. For this reason, the softest ionisation technique is often the best choice in the analysis of mixtures with MS/MS. In addition to softness , selectivity is an important factor in the selection of the ionisation technique. In polymer/additive analysis it is better to choose an ionisation technique which responds preferentially to the analytes over the matrix, because the polymer extract often consists of additives as well as a low-MW polymer matrix (oligomers). Few other reports deal with direct tandem MS analysis of extracts of polymer samples [229,231,232], DCI-MS/MS (B/E linked scan with CID) was used for direct analysis of polymer extracts and solids [69]. In comparison with FAB-MS, much less fragmentation was observed with DCI using NH3 as a reagent gas. The softness and lack of matrix effect make ammonia DCI a better ionisation technique than FAB for the analysis of additives directly from the extracts. Most likely due to higher collision energy, product ion mass spectra acquired with a double-focusing mass spectrometer provided more structural information than the spectra obtained with a triple quadrupole mass spectrometer. [Pg.403]


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See also in sourсe #XX -- [ Pg.3 , Pg.1764 ]




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Sampling techniques

Sampling techniques samples

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