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Polymer surface analysis

Among the techniques mentioned previously, XPS has the greatest impact on polymer surface analysis. A major additional source of chemical information from polymers comes from IR and Raman spectroscopy methods, These vibrational data can be obtained from the bulk and the surface region, although the information depth is much greater than with AES, XPS, or ISS. [Pg.518]

A series of examples involving either ESCA (or XPS) or SIMS applied to polymer surface analysis have been collected in the chapter entitled Surface Analysis in the volume by Kroschwitz [7], Surface Mass Spectrometry applied to the field of polymer/additives has been extensively reviewed recently by Bart [8]. [Pg.679]

Polymer Surface Analysis. The major technique used for the surface analysis of polymers has been X-ray photoelectron spectroscopy (XPS or ESCA). However, this technique is often not adequate to determine the molecular structure of polymers. This has prompted many workers to explore the potential of SIMS for this work (11-16). Significant problems encountered with ion beam bombardment in conjunction with electron beam charge neutralization have been drift in the polymer surface potential and thermal damage from the combined effects of the electron and ion beams. These problems do not exist when utilizing FAB in conjunction with photoelectron charge neutralization. [Pg.154]

In this review results from two surface science methods are presented. Electron Spectroscopy for Chemical Analysis (ESCA or XPS) is a widely used method for the study of organic and polymeric surfaces, metal corrosion and passivation studies and metallization of polymers (la). However, one major accent of our work has been the development of complementary ion beam methods for polymer surface analysis. Of the techniques deriving from ion beam interactions, Secondary Ion Mass Spectrometry (SIMS), used as a surface analytical method, has many advantages over electron spectroscopies. Such benefits include superior elemental sensitivity with a ppm to ppb detection limit, the ability to detect molecular secondary ions which are directly related to the molecular structure, surface compositional sensitivity due in part to the matrix sensitivity of secondary emission, and mass spectrometric isotopic sensitivity. The major difficulties which limit routine analysis with SIMS include sample damage due to sputtering, a poor understanding of the relationship between matrix dependent secondary emission and molecular surface composition, and difficulty in obtaining reproducible, accurate quantitative molecular information. Thus, we have worked to overcome the limitations for quantitation, and the present work will report the results of these studies. [Pg.380]

Explicitly developed are models of several theoretical multiphase distributions, with corresponding depth-profile results on thin-film plasma polymers, phase-separated block copolymers, and chemical reactions on fiber surfaces. Ion impact is treated from three points of view as an analytical fingerprint tool for polymer surface analysis via secondary ion mass spectroscopy, by forming unique thin films by introducing monomers into the plasma, and as a technique to modify polymer surface chemistry. [Pg.450]

The early developments of static SIMS (largely driven by polymer surface analysis requirements in terms of practical application) were carried out with noble gas... [Pg.4660]

D. Briggs, "Recent Advances in Secondary Ion Mass Spectrometry (SIMS) for Polymer Surface Analysis," Br. Polymer J.. 21,3-15 (1989). [Pg.147]

D. Briggs, Ed., Polymer Surface Analysis by XPS and Static SIMS, Cambridge University Press, Cambridge, 1998. [Pg.526]

Readers who are interested in delving a little deeper into polymer surface analysis by XPS are guided to the followdng works. Miller et al. (1986) produced a review of biomaterial applications for XPS with a heavy emphasis upon the theoretical aspects of the technique. A useful handbook for all aspects of XPS and Auger spectroscopies was edited by Briggs and Seah (1990). [Pg.424]

It is also common for pol3rmeric compoimds to form surface regions with compositions different from the bulk material, by selective diffusion of components. This process is termed blooming when the surface component is solid, and bleeding if it is liquid. Sulfur and fatty acid blooms can inhibit adhesion in rubber laminates (3). Laser desorption mass spectroscopy has been employed to identify surface species on vulcanized rubber (4). X-ray scattering methods for the study of polymer surfaces and interfaces have been reviewed (5). Other surface analysis techniques commonly used with polymers include attenuated total reflectance (6-8), electron microprobe (9), Auger electron spectroscopy (10), x-ray photoelectron spectroscopy (11), and scanning probe microscopic methods (12). Overviews on polymer surface analysis have been published (13,14). [Pg.312]

Instrumental Aspects. The early developments of static SIMS (largely driven by polymer surface analysis requirements in terms of practical application) were carried out with noble gas ion sources and quadrupole mass analyzers (QMS). The latter had the benefits of compactness, ready availability, and relatively straightforward adaptability to SIMS use in UHV systems. Although all the essential features of polymer surface analysis were introduced using this technology, the QMS has major limitations for static SIMS. Firstly, it is a serial device, so that only one mass at a time can be detected. Secondly, it has a limited mass range (<1000 Da) and the transmission (ie, sensitivity) decreases with mass (by at least m ). Thirdly, it is only possible to achieve a uniform mass resolution... [Pg.8051]

Garbassi and co-workers [15] have the reviewed the subject of polymer surface analysis including surface characterisation techniques using a wide variety of spectroscopies and measurement of contact angles and surface force. Also, studies on surfaces and applications of surface science, including wettability, adhesion, barrier properties, biocompatibility, reduction of friction, and wear resistance, were carried out. [Pg.185]

Molecular dynamics (MD) is an invaluable tool to study structural and dynamical details of polymer processes at the atomic or molecular level and to link these observations to experimentally accessible macroscopic properties of polymeric materials. For example, in their pioneering studies of MD simulations of polymers, Rigby and Roe in 1987 introduced detailed atomistic modeling of polymers and developed a fundamental understanding of the relationship between macroscopic mechanical properties and molecular dynamic events [183-186]. Over the past 15 years, molecular dynamics have been applied to a number of different polymers to study behavior and mechanical properties [187-193], polymer crystallization [194-196], diffusion of a small-molecule penetrant in an amorphous polymer [197-199], viscoelastic properties [200], blend [201,202] and polymer surface analysis[203-210]. In this article, we discuss MD studies on polyethylene (PE) with up to 120,000 atoms, polyethylproplyene (PEP), atactic polypropylene (aPP) and polyisobutylene (PIB) with up to 12,000 backbone atoms. The purpose of our work has been to interpret the structure and properties of a fine polymer particle stage distinguished from the bulk solid phase by the size and surface to volume ratio. [Pg.49]

Table 4.1. Basic criteria for the ideal polymer surface analysis technique... Table 4.1. Basic criteria for the ideal polymer surface analysis technique...
Table 4.2. Main features of some polymer surface analysis techniques ... Table 4.2. Main features of some polymer surface analysis techniques ...
Briggs [61] has reviewed applications of XPS in polymer surface analysis problems. The substantial... [Pg.420]

Principles and Characteristics Ion beam spectroscopy for polymer surface analysis comprises two general classes of experiments. One class uses a primary ion beam to generate secondary ions, which are then mass analysed. This technique, secondary ion mass spectrometry, has evolved into dynamic and static SIMS. Only the latter technique finds frequent application in polymer/additive analysis cfr. Chp. 4.2.1). The second class of ion beam spectroscopy measures the energy loss of a primary ion scattered from a surface. [Pg.441]

K. Kurosaki and T. Miki (eds.). Practical Polymer Surface Analysis, Kohdansha Scientific, Tokyo (2001). [Pg.446]

It is also common for some polymeric compounds to form surface regions with compositions different from the bulk material, by selective diffusion of components. This process is termed blooming when the surface layer is solid, and bleeding if the surface is liquid. Sulfur and fatty acid blooms can inhibit adhesion in rubber laminates.Gillberg has published an overview on polymer surface analysis. [Pg.42]

Table 6 Techniques Available for Polymer Surface Analysis... [Pg.24]


See other pages where Polymer surface analysis is mentioned: [Pg.366]    [Pg.366]    [Pg.367]    [Pg.367]    [Pg.4660]    [Pg.422]    [Pg.425]    [Pg.8052]    [Pg.8053]    [Pg.177]    [Pg.404]    [Pg.430]    [Pg.467]    [Pg.64]    [Pg.34]    [Pg.39]    [Pg.43]   
See also in sourсe #XX -- [ Pg.56 ]




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