Ion sources plasma

Glow discharge source (GDMS) Laser ion source (LIMS) Secondary ion source (SIMS) Sputtered neutral source (SNMS) Thermal ionization source (TIMS) Inductively coupled plasma ion source (ICP-MS)... 

The ion source is an essential component of all mass spectrometers where the ionization of a gaseous, liquid or solid sample takes place. In inorganic mass spectrometry, several ion sources, based on different evaporation and ionization processes, such as spark ion source, glow discharge ion source, laser ion source (non-resonant and resonant), secondary ion source, sputtered neutral ion source and inductively coupled plasma ion source, have been employed for a multitude of quite different application fields (see Chapter 9). 

Laser Ablation Coupled to an Inductively Coupled Plasma Ion Source... 

Different types of ion sources used in mass spectrometry are compared in Table 2.2. Several plasma ion sources applied in analytical atomic spectrometry were described by Broekaert.33... 

Recently, Hieftje et al.15-16 equipped a small double-focusing mass spectrograph built in house with Mattauch-Herzog geometry with several ion sources (such as glow discharge, an inductively coupled plasma ion source or a microwave plasma torch) and a novel array detector for simultaneous ion detection. 

Fourier transform ICR mass spectrometers together with any type of ion source, such as nanoESI, MALDI (or also an inductively coupled plasma ion source) permit mass spectrometric measurements to be performed at ultrahigh mass resolution (R = m/hm = 105—106) with a very low detection limit and the highest possible mass accuracy (Am = 10 3—10 4 Da). In addition, a high mass range is possible and FTICR-MS can be applied for MS/MS experiments.48 A comparison of different separation systems used in inorganic mass spectrometry is presented in Table 3.1. 

The mass range of most quadrupole based ICP-MS instruments is limited (1-300 u). By ICP-MS nearly all elements in the mass range of 6u (for lithium) to 238 u (for uranium) can be measured. Light elements at low concentration levels, such as H, O, N, C and noble gases, cannot be determined because an atmospheric pressure (argon) plasma ion source always contains traces of these light elements in the air and also in aqueous solution acidified with HN03. 

One of the more recent branches of atomic spectrometry, although perhaps the most exciting one, is atomic mass spectrometry, which has had a very important impact on science and technology. At present, atomic mass spectrometry is ordinarily performed using inductively coupled plasma ion sources and either a quadrupole or a scanning sector-field mass spectrometer as an analyser. The remarkable attributes of such a combination, being an indispensable tool for elemental analysis, include ... 

Fig. 2. Schematic diagram of the high temperature plasma ion source.

Milgram, K. E. Abatement of spectral interferences in elemental mass spectrometry design and construction of inductively coupled plasma ion sources for Fourier Transform ion cyclotron resonance instrumentation, Ph. D. Thesis, University of Florida, 1997, Diss. Abstr. Int., B 1998, 59(2), 639. 

The design of the TOF-MS interfaced to the plasma ion source is the most important issue in its development. In the next section the merits of differing designs are explored then the implementation of these designs is reviewed. 

At Argonne, a new positive ion injector for ATLAS based on an electron cyclotron resonance (ECR) plasma ion source is under construction (40). The... 

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