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Particle beam diagram

Fig. 9.10 Distribution of paramagnetic centers in potassium dithionate tablets after iiradiation with C and N -particle beams. The diagram is reproduced from [64] with permission from the American Chemical Society... Fig. 9.10 Distribution of paramagnetic centers in potassium dithionate tablets after iiradiation with C and N -particle beams. The diagram is reproduced from [64] with permission from the American Chemical Society...
Fig. 9.11 2D spectral-spatial ESRI diagram measured at X-band with an ELEXSYS E500/E540 X-EPRl spectrometer of potassium dithionate tablets irradiated with a C -particle beam. H. Gustafsson and E. Lund are acknowledged for permission to reproduce spectra prior to publication... [Pg.427]

Fig. 7-52. Schematic diagram of a particle-beam interface (HP 59980A). Fig. 7-52. Schematic diagram of a particle-beam interface (HP 59980A).
Figure Bl.24.14. A schematic diagram of x-ray generation by energetic particle excitation, (a) A beam of energetic ions is used to eject inner-shell electrons from atoms in a sample, (b) These vacancies are filled by outer-shell electrons and the electrons make a transition in energy in moving from one level to another this energy is released in the fomi of characteristic x-rays, the energy of which identifies that particular atom. The x-rays that are emitted from the sample are measured witli an energy dispersive detector. Figure Bl.24.14. A schematic diagram of x-ray generation by energetic particle excitation, (a) A beam of energetic ions is used to eject inner-shell electrons from atoms in a sample, (b) These vacancies are filled by outer-shell electrons and the electrons make a transition in energy in moving from one level to another this energy is released in the fomi of characteristic x-rays, the energy of which identifies that particular atom. The x-rays that are emitted from the sample are measured witli an energy dispersive detector.
A schematic diagram of the apparatus used in the energy transfer experiments is shown in Figure 8.22. The particles are produced and levitated in an electrodynamic levitator as described previously. Excitation is provided by the filtered output of either a Xe or Hg-Xe high-pressure arc. The intensity produced at the particle was found to be 10-50 mW/cm2. The fluorescence emitted from each of the levitated particles was monitored at 90° to the exciting beam using //3 optics, dispersed with a j-m monochromator, and detected with an optical multichannel analyzer. The levitator could be... [Pg.376]

FIGURE 11.74 Schematic diagram of aerosol particle mass spectrometer for measurement of composition of continuous beams of volatile and semivolatile particles (graciously provided by P. Zie-mann, 1998). [Pg.631]

Figure 10.11 Demonstration of the formation of a gas beam by an orifice (left), a transparent tube (middle), and an opaque tube (right), (a) Some particle trajectories in the vicinity of the orifice or within the tube, respectively (f>) resulting angle-dependent intensities /( ). The driving pressure pY is taken to be large compared to the pressure p2 where the beam formed is observed. The conditions for Knudsen flow are always fulfilled in the left-hand and middle diagrams but in the right-hand diagram they are only fulfilled in a restricted region (indicated by /eff, note the different lengths of the arrows which indicate the mean-free-path of some particles). If a particle hits a surface, such as at point A, it is assumed to be repelled with a cosine distribution. Figure 10.11 Demonstration of the formation of a gas beam by an orifice (left), a transparent tube (middle), and an opaque tube (right), (a) Some particle trajectories in the vicinity of the orifice or within the tube, respectively (f>) resulting angle-dependent intensities /( ). The driving pressure pY is taken to be large compared to the pressure p2 where the beam formed is observed. The conditions for Knudsen flow are always fulfilled in the left-hand and middle diagrams but in the right-hand diagram they are only fulfilled in a restricted region (indicated by /eff, note the different lengths of the arrows which indicate the mean-free-path of some particles). If a particle hits a surface, such as at point A, it is assumed to be repelled with a cosine distribution.
Figure 1. Schematic diagrams of TEB and LLS instrumentation. P, pinholes L, lenses B, polarizers C, cell Q, quarter wave plate PMT, photomultiplier tube HVG, high voltage generator MP, microprocessor TR, transient recorder CL, correlator CT, counter 6, scattering angle. For the TEB setup polarizers B-, B2 have polarization axis oriented at tt/4 with respect to the x-axis, as shown in (a). After the light beam passed through the cell with electric field in the x-direction containing a suspension of anisotropic particles and the quarter waveplate with its fast axis oriented at tt/4 with respect to the x-axis, the transmitted light beam is polarized in the direction of 71/4 + 6/2, as shown in (b). Analyzer B has polarization axis oriented at 3t/4 + a as shown in (c). Figure 1. Schematic diagrams of TEB and LLS instrumentation. P, pinholes L, lenses B, polarizers C, cell Q, quarter wave plate PMT, photomultiplier tube HVG, high voltage generator MP, microprocessor TR, transient recorder CL, correlator CT, counter 6, scattering angle. For the TEB setup polarizers B-, B2 have polarization axis oriented at tt/4 with respect to the x-axis, as shown in (a). After the light beam passed through the cell with electric field in the x-direction containing a suspension of anisotropic particles and the quarter waveplate with its fast axis oriented at tt/4 with respect to the x-axis, the transmitted light beam is polarized in the direction of 71/4 + 6/2, as shown in (b). Analyzer B has polarization axis oriented at 3t/4 + a as shown in (c).
Figure 1 Schematic diagram of a molecular beam machine. A gas at elevated pressure emanates from an orifice. The gas stream is collimated in three differential pumping stages to reduce the gas load on the target chamber. Only the part of the gas stream that reaches the target though all collimators is indicated as shaded. In the UHV target chamber a crystal is positioned in the beam path. The pressure and the target chamber and particles reflected or desorbed from the sample surface are detected by particle detectors. Inert beam flags can be moved into the beam to determine the beam intensity and the sticking coefficient. From Kleyn [22],... Figure 1 Schematic diagram of a molecular beam machine. A gas at elevated pressure emanates from an orifice. The gas stream is collimated in three differential pumping stages to reduce the gas load on the target chamber. Only the part of the gas stream that reaches the target though all collimators is indicated as shaded. In the UHV target chamber a crystal is positioned in the beam path. The pressure and the target chamber and particles reflected or desorbed from the sample surface are detected by particle detectors. Inert beam flags can be moved into the beam to determine the beam intensity and the sticking coefficient. From Kleyn [22],...
Does our consideration of the nature of the electron really matter Well, scientists in the late 19th century were concerned with cathode rays and their nature — were they waves Not according to Faraday s results. The rays were actually beams of particles, electrons. Need more evidence Look to the experiments of J.J. Thomson, as shown in the diagram below. [Pg.8]

A generalized schematic diagram for feedforward/feedback control of particle size in a continuous or semicontinuous crystallizer, such as that in Fig. 7-5, is shown in Fig. 7-6. The measurement device can be most easily envisioned as an in-line particle size analyzer such as a Lasentec focused beam reflectance measurement (FBRM), but it could also be a sampler/ offline device combination (even a plain microscope). The most common variant on this control schematic would be elimination of feedforward control, and perhaps of the fines trap as well. [Pg.144]

Figure 4.15 Schematic diagram of particle trajectories downstream from the exit of the converging nozzle, (a) Large particles follow their initial motion and their paths cross, producing a divergent beam, (b) Intermediate size particles bend tow ard the axis under the influence of the gas, producing a focused beam, (c) Very small particles follow the gas motion, producing a divergent beam. Figure 4.15 Schematic diagram of particle trajectories downstream from the exit of the converging nozzle, (a) Large particles follow their initial motion and their paths cross, producing a divergent beam, (b) Intermediate size particles bend tow ard the axis under the influence of the gas, producing a focused beam, (c) Very small particles follow the gas motion, producing a divergent beam.
Figure A. 11 Schematic diagram of the system components for particEe analysis by mass spectrometry, (a) Interface with external aerosol. Panicles ate introduced from the exterior through an aerosol beam with associated skimmers into (b) volatilizing and Ionizing region. The arrival of each panicle at the detector location is sensed by a laser that energizes a more powerful laser which focuses on the incoming particle to generate tons that pass to the (c) mass spectrometer, which may be of various types including quadrupole or time-of-flight. (From Sinha el al. 1983.)... Figure A. 11 Schematic diagram of the system components for particEe analysis by mass spectrometry, (a) Interface with external aerosol. Panicles ate introduced from the exterior through an aerosol beam with associated skimmers into (b) volatilizing and Ionizing region. The arrival of each panicle at the detector location is sensed by a laser that energizes a more powerful laser which focuses on the incoming particle to generate tons that pass to the (c) mass spectrometer, which may be of various types including quadrupole or time-of-flight. (From Sinha el al. 1983.)...

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