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Omega scan

Figure 7.18. XRD omega scan of an annealed electrodeposited GZO layer on a Ni-W substrate. [Reproduced with permission from Ref. 129. Copyright 2007 IEEE.]... Figure 7.18. XRD omega scan of an annealed electrodeposited GZO layer on a Ni-W substrate. [Reproduced with permission from Ref. 129. Copyright 2007 IEEE.]...
Reflections measured +/-F1, + K, + L 20 range 3 -> 60 deg Scan Type omega Scan width ... [Pg.37]

Fig. 3 The X-ray diffraction pattern of RUO2 nanorods grown on a Si substrate for 10 min at 600 °C. The inset is an omega scan of (220) peak. Major peaks indicate particular crystal orientation of the atoms in the nanorods... Fig. 3 The X-ray diffraction pattern of RUO2 nanorods grown on a Si substrate for 10 min at 600 °C. The inset is an omega scan of (220) peak. Major peaks indicate particular crystal orientation of the atoms in the nanorods...
Comparison Between 2Theta/Omega and Omega Scans... [Pg.10]

Fig. 1.17 Layer structure (a), lattice structure (b) and corresponding reciprocal lattice points arrangement (c) for a strained 5i/relaxed Sij-Jjex/Si(001) substrate. Orientation of (004) and (224) planes relative to the sample surface are shown in (b) and the corresponding reciprocal lattice points for both orientations are shown in (c). The high-resolution 2theta/omega scan near 5/ (004) from this sample is shown in (d)... Fig. 1.17 Layer structure (a), lattice structure (b) and corresponding reciprocal lattice points arrangement (c) for a strained 5i/relaxed Sij-Jjex/Si(001) substrate. Orientation of (004) and (224) planes relative to the sample surface are shown in (b) and the corresponding reciprocal lattice points for both orientations are shown in (c). The high-resolution 2theta/omega scan near 5/ (004) from this sample is shown in (d)...
The electrodeposited precursor films, annealed in air at 870 °C in the presence of a TBSBCCO pellet, produce a biaxial textured Tl-1223 phase, as confirmed by an XRD pole-figure measurement. The omega and phi scans indicate full-width at half-maximum (FWHM) values of only 0.92° and 0.6°, respectively, which indicates a very high-quality film. The superconductive transition temperature of the Tl-1223 film, determined resistively, was about 110 K. Figure 7.11... [Pg.220]

The morphology of silver nanopartilces on the cotton surface and paint samples was observed by field emission scanning electron microscopy (FE-SEM JSM-6700F, JEOL, Japan). The size and shape of the nanoparticles in solution were determined with transmission electron microscopy (TEM) (LEO-912-OMEGA, Carl Zeiss, Germany). [Pg.171]

Figure 9. Scanning electron micrograph of omega zeolite. Ageing of ucleation gel >40 days, 35°C crystallization 14 days, 120 C. Figure 9. Scanning electron micrograph of omega zeolite. Ageing of ucleation gel >40 days, 35°C crystallization 14 days, 120 C.
Microdiffraction.—Perhaps more important than SAD techniques, particularly in the context of catalyst research, microdiffraction allows the user to benefit from the small probe size generated in STEM in the structural analysis of small particles and localized areas in thin foils. If the small probe is stopped on a particle, then clearly a transmission diffraction pattern will be observable after the beam has traversed the sample, provided we have the means available for its display. In CTEM such a pattern will, of course, be formed by the imaging system in a manner identical to SAD, but in STEM the pattern must be scanned across the detector. This is accomplished by means of a set of post-specimen scan coils which once more scan the diffracted beams across the axial bright-field detector. Such a pattern is shown in Figure 13 where a beam of approximately 10 A FWHM was stopped on a small second-phase particle during the omega-phase transformation in a Zr-Nb alloy. The relatively poor definition of the reflection is a consequence of both the convergent nature in the probe (necessary in order to obtain the smallest probe sizes) and a S/N limited by the available current in the probe. Nevertheless, weak reflections with half-order indices are clearly visible between the main alloy reflections and it is therefore possible to attempt structural... [Pg.95]

Fig. 5.10.5 Three-omega technique the calculated normalized slope (d(AT)/d (log /)) of the thermal oscillation amplitude AT as a function of frequency/for a 100 nm thick aluminum heater element on a 500 nm thick Si02 layer and a 1 mm thick silicon substrate is shown as a function of thermal oscillation frequency/ With increasing frequency, the thermal wave penetrates deeper, allowing different sections of a (multilayered) sample to be scanned... Fig. 5.10.5 Three-omega technique the calculated normalized slope (d(AT)/d (log /)) of the thermal oscillation amplitude AT as a function of frequency/for a 100 nm thick aluminum heater element on a 500 nm thick Si02 layer and a 1 mm thick silicon substrate is shown as a function of thermal oscillation frequency/ With increasing frequency, the thermal wave penetrates deeper, allowing different sections of a (multilayered) sample to be scanned...
Kodali, D.R. Oxidative stability measurement of high-stability oils by pressure differential scanning calorimeter (PDSC). J. Agric. Food Chem. 2005, 53, 7649-7653. Kris-Etherton, P.M. Harris, W.S. Appel, L.J. Fish consumption, fish oil, omega-3 fatty acids and cardiovascular disease. Circulation 2002, 106, 2747-2757. [Pg.312]

Powder X-ray diffractometry shows that the lattice is orthorhombic, space group Pnali, with a = 13.146(5) k,b 6.584(2) A, c = 10.771(6) A. Typical width of single-crystal X-ray omega (cu) scan peaks is 0.15°, suggesting the absence of domain walls. The techniques available for visualizing ferro-electronic domains in KTP - (pyroelectric, piezoelectric, and electrooptic) should be applicable to KTA as well. [Pg.145]


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