Non-contact atomic force microscopy

Raza H, Pang C L, Haycock S A and Thornton G 1999 Non-contact atomic force microscopy imaging of 7102(100) surfaces Appl. Surf. Sc/. 140 271... 

Non-contact atomic force microscopy (NC-AFM) Magnetic force microscopy (MFM)... 

Nevertheless, it is possible to obtain truly atom-by-atom measurements from suitable surfaces. Iwasawa and coworkers reported atom-resolved images of the TiO2(110) surface by non-contact atomic force microscopy, revealing the correct... 

F. J. Giessibl, H. Bielefeldt, S. Hembacher and J. Mannhart, Calculation of the optimal operating parameters in non-contact atomic force microscopy, Appl. Surf. Sci. 140, 352 (1999). 

H. Yamada, Non Contact Atomic Force Microscopy, S. Morita, R. Wiesendanger and E. Meyer, eds. (Springer Verlag, 2002), pp. 193-213. 

The following section describes the use of the two-timing approximation for the analysis of QCM data. The same formalism is also used in the field of non-contact atomic force microscopy [28,29]. In the latter context, the tip-sample interaction perturbs the oscillation of the cantilever. As long as the tip-sample force is weak compared to the force needed to bend the cantilever, the interaction potential can be reconstructed from the frequency of the cantilever as a function of amplitude and mean vertical distance. 

S. Tanaka, B. Grevin, P. Rannou, H. Suzuki and S. Mashiko. Conformational studies of self-organized regioregular poly(3-dodecylthiophene)s using non-contact atomic force microscopy in ultra high vacuum condition. Thin Solid Films 499(1-2), 168-173 (2006). 

Our efforts in this area were initiated in 1995 with investigations of the electrodeposition of silver (26, 27) and, soon thereafter, platinum (28) nanoparticles on HOPG surfaces. The primary characterization tool employed in these experiments was ex situ non-contact atomic force microscopy (NC-AFM). In the silver work, HOPG electrode surfaces were examined by NC-AFM after the application of large amplitude potentiostatic pulses with amphmdes of —100 to —500 mV (vs. Ag/Ag+) and durations of 10-50 msec in dilute silver-plating solutions. These images looked dramatically different from the... 

T, Fukuma, K. Kobayashi, H. Yamada, and K Matsushige, Non-contact atomic force microscopy study of copper-phthalocyanines Submolecular-scale contrasts in topography and energy dissipation,/ Appl Phys. 95, 4742 (2004). 

C. (2011) Polarization effects in non-contact atomic force microscopy a key to model the tip-sample interaction above charged adatoms. Phys. Rev. B, 83, 035411. 

S. (2005) Imaging the restatom of the Ge(lll)-c(2 X 8) surface with non-contact atomic force microscopy at room temperature. Nanotechnology, 16, S68-S72. 

S. (2005) Non-contact atomic force microscopy study of the Sn/Si(lll) mosaic phase. Appl. Surf. Sci., 241, 23-27. 

Lauritsen, J.V. and Reichling, M. (2010) Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces. J. Phys Condens. Matter, 22, 263001. 

Schutte, )., Bechstein, R., Rahe, P., Rohlfing, M., Langhals, H., and Kflhnle, A. (2009) Imaging perylene derivatives on mtile TiO2(110) by non-contact atomic force microscopy. Phys. Rev. B, 79, 045428. 

Loske, F. and Kiihnle, A. (2009) Manipulation of Qo islands on the rutile TiO2(110) surface using non-contact atomic force microscopy. Appl. Phys. Lett., 95, 043110. 

L, and Morita, S. (2006) Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentation. Nanotechnology, 17, S142-S147. 

Juszczak, L., Fortuna, T. Krok, F. (2003). Non-contact Atomic Force Microscopy of Starch Granules Surface, Part I Potato and Tapioca Starches. Starch, 55,1-7. 

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