Morphology, Roughness, and Pattern Formation in Nanolayers

The results showed that that it is possible to selectively control the film morphology by altering the solution concentration used. Low-concentration polymer solutions favored the formation of flat inplane phase-separated bilayers, whilst at intermediate concentrations the films formed consisted of an in-plane phase-separated bilayer with an undulating interface some secondary phase-separated pockets rich in d-PMMA in the PS-rich layer, and vice versa, were also observed. The use of high-concentration solutions resulted in laterally phase-separated regions with sharp interfaces. 

Structure (1-100 (itn). An acid atalyzed (generated by UV exposure of the photoacid) reactive modification of the polymer blend film converted part of the organic template to a sUica network through exposure to precursor vapors. The impact of the polymer blend composition on the structure of the porous silica films was examined with the stmcture of the porous silica films determined using X-ray diffraction (XRD), SEM, transmission electron microscopy (TEM), spectroscopic ellipsometry (SE), and ellipsometric porosimetry (EP). 

The optical properties and thickness of the films were quantified using spectroscopic ellipsometry (M-2000, J.A. Woollam). Film porosity was calculated from the Bruggemann effective medium approximation (BEMA) model [11,54], assuming that only two phases existed amorphous silica and voids. The refractive index of the film was determined and directly translated into the film porosity, knowing the refractive index of the wall framework. The wall was assumed to be solely amorphous silica with a reported refractive index of 1.458. The film porosity calculated was found to be in the range of 50-60%. 

It was concluded that simple variations in processing parameters would allow the pore morphology to be tuned to create high-surface-area materials with 

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