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Beams splitter

Figure B2.5.8. Schematic representation of laser-flash photolysis using the pump-probe technique. The beam splitter BS splits the pulse coming from the laser into a pump and a probe pulse. The pump pulse initiates a reaction in the sample, while the probe beam is diverted by several mirrors M tluough a variable delay line. Figure B2.5.8. Schematic representation of laser-flash photolysis using the pump-probe technique. The beam splitter BS splits the pulse coming from the laser into a pump and a probe pulse. The pump pulse initiates a reaction in the sample, while the probe beam is diverted by several mirrors M tluough a variable delay line.
The optical power A oscillates between tlie guides depending upon tlie propagation distance. Clearly, by controlling z, (3 and k, a wide variety of passive devices (beam splitters, combiners, attenuators, and interferometers) can be readily constmcted. [Pg.2868]

Fig. 6. Schematic diagram of a Raman microprobe where BS = beam splitter, L = lens, and MI = mirror, (a) The illumination pathway (b) the collection... Fig. 6. Schematic diagram of a Raman microprobe where BS = beam splitter, L = lens, and MI = mirror, (a) The illumination pathway (b) the collection...
Fig. 25-2. Double-beam, double-pass transmissometer for measuring smoke density in stacks. A[, chopper wheel A, beam gating wheel A3, aperture D, detector Fj, spectral filter F2, solenoid-activated neutral density filter L, lamp M, half-mirror/beam splitter Rj, solenoid-activated zero calibration reflector R2, retroreflector (alignment bullseye not shown). Design patented. Source Drawing courtesy of Lear Siegler, Inc. Fig. 25-2. Double-beam, double-pass transmissometer for measuring smoke density in stacks. A[, chopper wheel A, beam gating wheel A3, aperture D, detector Fj, spectral filter F2, solenoid-activated neutral density filter L, lamp M, half-mirror/beam splitter Rj, solenoid-activated zero calibration reflector R2, retroreflector (alignment bullseye not shown). Design patented. Source Drawing courtesy of Lear Siegler, Inc.
Short- and long-term drift in the spectral output can be caused by several factors drift in the output of the infrared light source or of the electronics, aging of the beam splitter, and changes in the levels of contaminants (water, CO2, etc.) in the optical path. These problems are normally eliminated by rapid, routine calibration procedures. [Pg.424]

Potential CVD applications are beam splitter and interference layer in optical devices and detector for ethyl alcohol. [Pg.314]

Reflective coatings are found in astronomical instruments, telescopes, spectrometers, rangefinders, projectors, microfilm readers, television tubes, diffraction gratings, interferometers, beam splitters, lasers, and many other applications. [Pg.407]

Figure 2. Transmittance spectral profile of a coating consisting of a quarterwave stack of 23 layer stack centered on 800 nm. Light gray without ripple control. Dark gray with ripple control. It can be used either as a intermediate band filter, or a shortwave dichroic beam splitter or a longwave one. Figure 2. Transmittance spectral profile of a coating consisting of a quarterwave stack of 23 layer stack centered on 800 nm. Light gray without ripple control. Dark gray with ripple control. It can be used either as a intermediate band filter, or a shortwave dichroic beam splitter or a longwave one.
Figure 6. Reflectance for s- and p- polarization of a 8 layers 45° beam splitter. Figure 6. Reflectance for s- and p- polarization of a 8 layers 45° beam splitter.
There was thus the need for optical experiments showing the flaws of classical electrodynamics. An important difference between a wave and a particle is with respect to a beam splitter a wave can be split in two while a photon can not. An intensity correlation measurement between the two output ports of the beamsplitter is a good test as a wave would give a non zero correlation while a particle would show no correlation, the particle going either in one arm or the other. However, when one takes an attenuated source, such as the one used by Taylor, it contains single photon pulses but also a (small) fraction of two... [Pg.353]

Grangier, R, Roger, A., Aspect, A., 1986, Experimental Evidence for a Photon Anticorrelation Effect on a Beam Splitter a New Light on Single-Photon Interference, Europhys. Lett. 1, 173... [Pg.357]

Optical parametric oscillator (OPO, see 20) is the real equivalent to the radio frequency shifter however OPO can be replaced by a simple addition of a local oscillator (e.g. laser) through a beam splitter. Multiplication takes place at the level of detectors. For sake of S5mimetry, detectors can be placed at both output of the beam splitter, the intermediate frequency is then the output of the differential amplifier. [Pg.368]

An industrial microscope with a long-working distance 20 X objective is used for the collection of the chromatic interference patterns. They are produced by the recombination of the light beams reflected at both the glass/chromium layer and lubricant/steel ball interfaces. The contact is illuminated through the objective using an episcopic microscope illuminator with a fiber optic light source. The secondary beam splitter inserted between the microscope illuminator and an eyepiece tube enables the simultaneous use of a color video camera and a fiber optic spectrometer. [Pg.11]

Fig. 1—Profile measurement technique of Champper 2000+. A surface measurement is made with a linearly polarized laser beam that passes to translation stage which contains a penta-prism. The beam then passes through a Nomarski prism which shears the beam into two orthogonally polarized beam components. They recombine at the Nomarski prism. The polarization state of the recombined beam includes the phase information from the two reflected beams. The beam then passes to the nonpolarizing beam splitter which directs the beam to a polarizing beam splitter. This polarizing beam splitter splits the two reflected components to detectors A and B, respectively. The surface height difference at the two focal spots is directly related to the phase difference between the two reflected beams, and is proportional to the voltage difference between the two detectors. Each measurement point yields the local surface slope [7]. Fig. 1—Profile measurement technique of Champper 2000+. A surface measurement is made with a linearly polarized laser beam that passes to translation stage which contains a penta-prism. The beam then passes through a Nomarski prism which shears the beam into two orthogonally polarized beam components. They recombine at the Nomarski prism. The polarization state of the recombined beam includes the phase information from the two reflected beams. The beam then passes to the nonpolarizing beam splitter which directs the beam to a polarizing beam splitter. This polarizing beam splitter splits the two reflected components to detectors A and B, respectively. The surface height difference at the two focal spots is directly related to the phase difference between the two reflected beams, and is proportional to the voltage difference between the two detectors. Each measurement point yields the local surface slope [7].
Figure 4.6 shows an apparatus for the fluorescence depolarization measurement. The linearly polarized excitation pulse from a mode-locked Ti-Sapphire laser illuminated a polymer brush sample through a microscope objective. The fluorescence from a specimen was collected by the same objective and input to a polarizing beam splitter to detect 7 and I by photomultipliers (PMTs). The photon signal from the PMT was fed to a time-correlated single photon counting electronics to obtain the time profiles of 7 and I simultaneously. The experimental data of the fluorescence anisotropy was fitted to a double exponential function. [Pg.62]

Figure 4.6 Block diagram of the apparatus for the fluorescence depolarization measurement. The dashed and solid arrows indicate the light paths ofthe excitation pulse and the fluorescence from the sample. OBJ microscope objective, M mirror, L lens, DM dichroic mirror, LP long-pass filter, PH pin-hole, PBS polarizing beam splitter, P polarizer, PMT photomultiplier. Figure 4.6 Block diagram of the apparatus for the fluorescence depolarization measurement. The dashed and solid arrows indicate the light paths ofthe excitation pulse and the fluorescence from the sample. OBJ microscope objective, M mirror, L lens, DM dichroic mirror, LP long-pass filter, PH pin-hole, PBS polarizing beam splitter, P polarizer, PMT photomultiplier.
Figure 7.3 A schematic of a two-beam photon-force measurement system. Obj objective lens (lOOx oil immersion, N.A. 1.4), PBS polarization beam splitter, FI color filter for eliminating red illumination laser beam, F2 color filter for eliminating green illumination laser... Figure 7.3 A schematic of a two-beam photon-force measurement system. Obj objective lens (lOOx oil immersion, N.A. 1.4), PBS polarization beam splitter, FI color filter for eliminating red illumination laser beam, F2 color filter for eliminating green illumination laser...
Figure 12.3 (a) Block diagram of the third-generation SFG spectrometer. A beam splitter... [Pg.714]

Fig. 3.12. Reaction cell. 1 - the evaporator 2 - thermocouple 3 - beam splitter 4 - semiconductor sensor (ZnO) 5 - collimating holes 6 - atom beam shutter... Fig. 3.12. Reaction cell. 1 - the evaporator 2 - thermocouple 3 - beam splitter 4 - semiconductor sensor (ZnO) 5 - collimating holes 6 - atom beam shutter...

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