Ion-probe microanalysis

Acronyms I PM A, SIMP (scaiming ion microprobe) PMP (proton microprobe) 

Ion probe microanalysis is a technique in which the sample is bombarded by a well focused beam of primary ions (diameter less than 10 pm) and the secondary ions ejected from the sample are detected in a mass spectrometer. 

When a beam of charged particles passes through a thin specimen, the beam transmitted in the forward direction includes some particles that scattered elastically off atomic nuclei or lost energy due to interaction with electrons (inelastically scattered) as well as those particles that were left unscattered. An image formed with this forward-transmitted beam is referred to as a bright field image. 

Ion probe microanalysis is suited to high sensitivity multi-element analysis of both thick and thin specimens. Sohd state samples are required. It is not possible to perform elemental analysis for an extended structure of irregular shape except by repeated measurements with a fbted beam at many selected points. 

In order to measure the distribution of elements along a hne or map elemental distribution over an area, the focussed beam spot must be scanned and the detector signal recorded as a function of the displacement of the beam from its normal position. When a beam of ions scans an area of a specimen, the emitted radiation carries information in three degrees of freedom the two scanning dimensions and the energy. 

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IPMA ion probe microanalysis (also known as ion microprobe mass analysis) IPPC-directive Integrated Pollution Prevention and Control directive... 

During a considerable long period, the gaseous chemisorption method is the sole one to probe the surface species of solid catalysts. Some of the modern techniques for surface measuring are Measurements of effusion works, Auger electron spectroscopy (AES), Electron spectroscopy of chemical analysis (ESC A), X-ray photoelectron spectroscopy (XPS), Electron probe microanalysis (EPMA), Ion probe microanalysis (IPM), Ion scattering spectroscopy (ISS), Second ion mass spectroscopy (SIMS), Low energy electron diffraction (LEED), Vibration spectrum and Mossbauer spectroscopy etc. All these techniques provide favorable conditions for the surface research indepth. 

FSOT fused silica open tubular (column) IPMA ion probe microanalysis... 

The limitations in sensitivity and in depth resolution of the electron-probe microanalyzer prompted the development of ion-probe microanalysis. This technique is based on mass spectro-graphic analysis of the secondary ions emitted from a sample under the impact of a focused and accelerated primary ion beam. This type of analysis also offers, in comparison with the electron probe, the possibilities of isotopic analysis and the investigation of elements of low atomic number, including hydrogen, at trace concentrations. 

Ion probe microanalysis Microscopic traces, surface layers 1 ppm Semiquantitative now 123... 

Ion probe microanalysis X — X X — Development of lower cost instruments... 

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