Interference microscopic methods

Microscopic Methods Interference microscopy (24,25) Coherent QENS (26) PFGNMR(12) NMR-lifetime (12) Incoherent QENS... 

Others have used interference microscopic 36> and gravimetric methods 37> to compare the density of the residual polymer on the various steps. 

In the first part of the chapter several methods used to observe morphology of polymer blends are presented. Various optical microscopic methods are reviewed, including such modem techniques as photon tunneling microscopy (PTM), scanning near-field optical microscopy (SNOM), phase measurement interference microscopy (PMIM), surface plasmon microscopy (SPM) and optical waveguide microscopy (OWM). Many of these methods have been developed to study surfaces and thin films. However, they can also be applied to polymer blend morphology. 

Speidel [237] replaced the solid spacer layer by a liquid one and made small embedded thin phase objects visible. Using liquid solutions as the spacer layer, Pulker and Junger [238] studied crystallisation phenomena, especially spiral growth of organic compounds in situ, by the application of the interference filter method together with a microscope and an optical spectrometer. Figure 48 shows a growth spiral of 2,3-benzofluorene. 

Biogenic silica is subject to variable and rather unpredictable dissolution on burial in sediment, which interferes with the method. There are ways to estimate the amount of dissolntion using electron microscopic methods (Battarbee, 1980). 

The compatibility of the polymers in solutions was determined by dynamic viscosity measurements using a rotational viscometer at 293 K and shear rate 1312 s. The morphology of the film cast from a solution was examined with a polarization-interference microscope by differential method, at magnification of 250x. Dynamic mechanical measurements were made using direct reading visco-elastometer, the Rheovibron. The temperature was scanned... 

Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope. 

Other methods were used to follow a heterogenous reaction, such as methods to measure (discontinuous) the sizes of a crystal under a microscope, optical methods to measure the thickness of a layer by interference, and methods to measure the electrical resistance. All these, sometimes complementary, methods are dehcate, either to implement or to coimect to the extent of the transformation. 

Allmand, T. R. and Houseman, D. H. 1970. Thin film interference — anew method for identification of nonmetallic inclusions. Microscope 18, 11-23. 

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