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Input fuse

Author s Comments This is probably a 2A fuse with T —that is, Time Delay. The time delay ensures that the fuse will not blow due to the high inrush current of most switchers. However, also note that the max load being applied is 3A. But this is a 24V to 5V conversion, so the input supply current will be almost 24/5 5 times less, that is, only 0.6A for a 3A load, not even close to 2A. That cannot be the issue. In any case, there is almost no way the input fuse can blow if the switch of the IC has not failed. A blown fuse in power supplies is almost 99.9999% the result of a switch failure, caused by some other malfunction that we need to investigate. Further, no problems can start once the fuse blows, as the customer seems to state That seems like an obvious typo, but it should have been clarified delicately. [Pg.270]

AC supply input 240 V a.c. 50Hz/120V a.c. 50Hz a.c. input fuse. [Pg.475]

Unnecessary loading of the breakdown fuse through transient overvoltages can be avoided by connection to a r element which consists of a length choke and transverse capacitors. So-called iron core chokes are most conveniently used for series chokes, which are usual in power electronics. A damping element with a 61-fjF capacitor is advised at the input and output of the r element. [Pg.340]

Proteetion of the load and of the power supply from failures in the load should be an important eonsideration within all switehing power supply designs. It is important to know what failures are likely to oeeur within the switehing power supply and the load. An exereise that is frequently required in military designs is what is ealled a FMEA (failure modes and effeets analysis), where eaeh eom-ponent is hypothetieally assumed to fail open-eireuited and then short-eireuited. With sueh failures, how does eaeh failure affeet the other seetions of the eireuit This antieipation of failures ean make a power supply design robust. It is the responsibility of the power supply designer to provide proteetion to the load eireuitry from anomalies eneountered from the input line and failures within the supply and the load eireuitry. Often, proteetion sehemes ean be easeaded to provide redundant proteetion in the event of a failure in a proteetion eireuit. A fuse or a eireuit-breaker usually provides sueh a baek-up funetion. [Pg.83]

In order to prepare the final multi-class predictor map, the input weighted layers are fused using various Fuzzy operators (Fig. 5). Figure 6 is a reclassified final Fuzzy map, predicting the high potential areas for further drilling at East-Kahang. To validate the accuracy of the Fuzzy model, the projected Cu values of the completed drill holes are overlain on the final predictive map. The results show... [Pg.383]

The input data for the shape analysis methods are provided by well-established quantum chemical or empirical computational methods for the calculation of electronic charge distributions, electrostatic potentials, fused spheres Van der Waals surfaces, or protein backbones. The subsequent topological shape analysis is equally applicable to any existing molecule or to molecules which have not yet been synthesized. This is precisely where the predictive power of such shape analysis lies based on a detailed shape analysis, a prediction can be made on the expected activity of all molecules in the sequence and these methods can select the most promising candidates from a sequence of thousands of possible molecules. The actual expensive and time-consuming synthetic work and various chemical and biochemical tests of... [Pg.177]

Fig. 6. (A) El binding assay. Lane M contains the input 32P-labeled DNA fragments from pKS+ ori. These fragments were incubated with 100 pL TNT lysate containing either no El protein (-), EE-E1 protein (El with an EE epitope fused at the N-terminus), or wild-type El. DNA-protein complexes were immunoprecipitated with either El -specific antiserum (SSQN) or EE-specific antibody. El-bound DNA was extracted and analyzed by gel electrophoresis (option 1). (B) E1-E2 cooperative binding assay. Lane M contains the input 32P-labeled DNA fragments from pKS+ ori. These fragments were incubated with 50 pL control TNT lysate (lane 1), 25 pL El lysate and 25 pL control lysate (lane 2) and 25 pL El lysate and 25 pL control lysates (lanes 3-6). Lane 3 contains wild-type E2 protein and lanes 4-6 contain E2 proteins with deletions in the hinge region (15). DNA-protein complexes were immunoprecipitated with El-specific antiserum (SSQN), and El-bound DNA was extracted and analyzed by gel electrophoresis (option 2). Fig. 6. (A) El binding assay. Lane M contains the input 32P-labeled DNA fragments from pKS+ ori. These fragments were incubated with 100 pL TNT lysate containing either no El protein (-), EE-E1 protein (El with an EE epitope fused at the N-terminus), or wild-type El. DNA-protein complexes were immunoprecipitated with either El -specific antiserum (SSQN) or EE-specific antibody. El-bound DNA was extracted and analyzed by gel electrophoresis (option 1). (B) E1-E2 cooperative binding assay. Lane M contains the input 32P-labeled DNA fragments from pKS+ ori. These fragments were incubated with 50 pL control TNT lysate (lane 1), 25 pL El lysate and 25 pL control lysate (lane 2) and 25 pL El lysate and 25 pL control lysates (lanes 3-6). Lane 3 contains wild-type E2 protein and lanes 4-6 contain E2 proteins with deletions in the hinge region (15). DNA-protein complexes were immunoprecipitated with El-specific antiserum (SSQN), and El-bound DNA was extracted and analyzed by gel electrophoresis (option 2).

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