Imaging atomic spectroscopy

Image Devices. Although he never assembled an actual TV-spectrometer, Margoshes was the first to recognize the potential of TV-type detectors in analytical atomic spectroscopy. In a series of reports (50,51,52) he speculated on the advantages of using an SEC tube [vide infra] to detect radiation dispersed by an echelle spectrograph. These reports and the recent availability of various solid-state array detectors have prompted numerous... 

While these data show that the image dissector is superior to the silicon target vidicon in several respects for atomic spectroscopy, the silicon vidicon and other integrating detectors retain significant advantages for molecular absorption (39) and fluorescence spectroscopy (40) where resolution requirements are not so demanding, available radiant fluxes are higher, and a... 

Felkel, H. L., Jr., "Evaluation of imaging detector coupled to an echelle grating spectrometer for atomic spectroscopy", Ph.D. Thesis, Purdue University, 1978. 

In addition to its power of directly imaging atomic structures of crystals, H RTEM is often equipped with several other powerful devices for characterization of solids, such as electron diffraction (ED), EDX, electron energy loss spectroscopy (EELS), scanning transmission electron microscopy (STEM) and so on. In this chapter, only the most commonly used supporting techniques for HRTEM, ED and EDX, are discussed in detail. 

These systems have two major limitations on the one hand, the number of channels must be small as each sensing element, however miniaturized, occupies considerable space with Its independent associated electronics on the other hand, and as a result of the first limitation, the spectral Information obtained is necessarily partial, although in some cases (e.g. in atomic spectroscopy and routine UV-vIsible determinations) It Is more than sufficient. Nevertheless, the development and consolidation of electronic image sensors have displaced them to a less prominent place in the context of simultaneous multi-detection. 

Al-Kassab, T., Wollenberger, H., Schmitz, G. and Kirchheim, R. (2002) Tomography by atom probe field ion microscopy, in High-resolution Imaging and Spectroscopy of Materials (eds F. Ernst and M. Ruble), Springer, p. 271. 

Adams, F. Analytical Atomic Spectrometry and Imaging Looking Backward from 2020 to 1975. Spectrochimica Acta, Part B Atomic Spectroscopy 2008, 635,738-745. 

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