Image-recording modes

The system should support all the inspection types available in the PSP-3 P-scan, T-scan and Through Transmission, TOFD and A-scan. It should be possible to record data for all the inspection types simultaneously. The developments in computer hardware, in particular disk storage, during the last years have made it feasable to increase the emphasis on the A-scan recording modes. It has also been feasible to extend the P-scan format to include P-scan image storage in a full 3D format, that allows cross-section views to be generated off-line. 

Table I. Comparison between heat- and photon-mode image recording...

Research on liquid crystalline polymers(LCP) is a fashionable subject with the goal of developing speciality polymers of superior mechanical and thermal properties. Besides these properties, other interesting properties of LCP have not been fully utilized. We are trying to use thermotropic LCP for photon-mode image recording material. 

For a duration of 50 minutes every 5 minutes, the air conditioning system of the facility is switched between these two conditions. Thus it is possible to determine an averaged skin-bulk temperature difference every 10 minutes. In the first mode the infrared imager records the bulk temperature, and in the second mode the surface temperature. 

HEAT-MODE AND PHOTON-MODE IMAGE RECORDING (7)... 

The micropatterning of PAMAM dendrimers relies on (xCP with a hy-drophilized stamp. An UV/ozone treatment increases the surface energy of the PDMS [159,160] and thus provides the necessary homogeneous loading of the stamp (Fig. 16). Contact mode AFM height and friction images recorded on micropatterned dendrimer surfaces show that elevated areas... 

Fig. 5.26 The AFM images (recorded in tapping mode) evidenced the morphological changes on the local nanostructure by annealing the film to water vapor. The lamellar structure top) is transformed into a cubic phase bottom). Reproduced with permission from ref. [128]...

An image recorded in feedback mode can be processed to yield the substrate topography (height) using Eq. (4) for a conducting substrate or Eq. (5) for an insulator. This is not possible if the reactivity or conductivity of the substrate is nonuniform. 

Figure 2. Selected tapping mode AFM images recorded from avidin/Ag nanoparticle LbL films composed of (a) 2 bilayers, (b) 4 bilayers, (c) 6 bilayers, (d) 8 bilayers, (e) 12 bilayers, and (f) 14 bilayers.

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