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IEEE-1394 devices

The next option allows you to select an OHQ-compliant IEEE-1394 device to route a DV video signal through your camcorder and out to a television set. When an OHCI device is selected, additional information is displayed in the Details box. [Pg.283]

Additional options become visible when an OHCI-compatible IEEE-1394 device is selected. [Pg.283]

Appendix C herein gives the IEEE device numbers that are most commonly used, together with their descriptions that are typically used in the oil industry. [Pg.313]

The requirements for the different types of HV and LV circuits in a typical oil industry power system are summarised below. The IEEE device numbers commonly used in the oil industry are listed in sub-section C.l. [Pg.533]

W. D. Johnston, Jr., and K. E. Strege, 38th Annual IEEE Device Research Conf. Abstracts, Cornell University, Vol. IVB-3, June 1980. [Pg.239]

Y. Takemuia and co-workeis, IEEE Trans. Electron. Devices ED-32(8), 1402 (1985). [Pg.438]

J. A. Oberteuffer, Magnetic Separation M Kevieiv of Principles, Devices and Applications, Institute of Electrical and Electronics Engineers, Inc., 1977. P. A. Cliermemnykli and I. V. Kurchatov, IEEE Trans. Magnetics, 28(1), 651—658 (Jan. 1992). [Pg.432]

Ensure that the instrument has appropriate output ports to drive other devices such as storage and computational facilities. Wherever possible, these ports should conform to the IEEE interface standards. [Pg.240]

Tuckerman D, Pease RFW (1981) High performance heat sinking for VLSI. IEEE Electron Device... [Pg.97]

Hetsroni G, Mosyak A, Segal Z (2001) Nonuniform temperature distribution in electronic devices cooled by flow in parallel micro-channels. IEEE Trans Comp Packag Technol 24(1) 16-23 Ho CM, Tai Y-C (1998) Micro-electronic mechanic systems (MEMS) and fluid flows. Ann Rev Fluid Mech 30 5-33... [Pg.189]

Awaya, N., et al., Evaluation of a Copper Metallization Process and the Electrical Characteristics of Copper-Interconnected Quarter-Micron CMOS, IEEE Transactions of Electron Devices, 43(8) 1206-12 (August 1996)... [Pg.381]

M. Nitta and M. Haradome, IEEE Trans. Electron Devices, 26 (1979) 247 - 249... [Pg.164]

T. Miyamoto, H. Sakurai, H. Takabaya-shi, M. Aoki 1989, (A development of a permanent magnet assembly for MRI devices using Nd-Fe-B material), IEEE Trans. Magn. 25, 3907-3909. [Pg.89]

Xing L., Zuoqing W., Cheng J.K., Viens M., Cheeke J.D.N., Ultrasonic thin-walled tube wave structure for sensing devices, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control 1996 43 331-336. [Pg.384]

M. Barbara, A. Bonfiglio, L. Raffo, A. Alessandrini, P. Facci, and I. Barak, A SMOS fully integrated sensor for electronic detection of DNA hybridization. IEEE Electron Device Lett. 27, 595-597 (2006). [Pg.234]

Y. Kim, S. Lopatin, Y. Shacham-Diamand, in Proc. IEEE/Comell Conf. on Adv. Concepts in High Speed Semicond. Devices and Circuits, M. Adlerstein, (eds.), IEEE Electron Devices Soc., 192 (1997). [Pg.271]

Landauer R (1996) Need for critical assessment. IEEE Trans Electron Devices 43 1637... [Pg.262]

Chason, M. Brazis, P. W. Zhang, J. Kalyanasundaram, K. Gamota, D. R. 2005. Printed organic semiconducting devices. Proc. IEEE 93 1348-1356. [Pg.28]

Kane, M. G. Goodman, L. Firester, A. H. van der Wilt, P. C. Limanov, A. B. Im, J. S. 2005.100MHz CMOS circuits using sequential laterally solidified silicon thin-film transistors on plastic. IEEE International Electron Devices Meeting Tech. Digest 2005 1087-1089. [Pg.29]

Hannah, H. I. Tiwari, S. Khan, I. 1996. Fast and long-retention-time nanocrystal memory. IEEE Trans. Electron Devices. ED-43 1553-1558. [Pg.32]

Chen, C.-Y. Kanicki, J. 1996. High field-effect-mobility a-Si H TFT based on high deposition rate PECVD materials. IEEE Electron Device Lett. 17 437-439. [Pg.107]

Sameshima, T. Usui, S. Sekiya, M. 1986. XeCl excimer laser annealing used in the fabrication of poly-Si TFTs. IEEE Electron Device Lett. 7 276-278. [Pg.154]

Siemer, K. Klaer, J. Luck, I. Braunig, D. 2000. Influence of crystal orientation on device performance of CuInS2 solar cells. Proceedings of the 28th IEEE Photovoltaic Specialists Conference. IEEE, Piscataway, NJ. pp. 630-633. [Pg.197]

Lorenz, M. Hochmuth, H. Natusch, D. Lippold, G. Svetchnikov, V. L. Kaiser, T. Hein, M. A. Schwab, R. Heidinger, R. 1999. Ag-doped double-sided PLD-YBCO thin films for passive microwave devices in future communication systems. IEEE Trans. Appl. Supercond. 9 1936-1939. [Pg.237]

Subramanian, V. Frechet, J. Chang, P. Huang, D. Lee, J. Molesa, S. Murphy, A. Redinger, D. Volkman, S. 2005. Progress toward development of all-printed RFID tags Materials, processes, and devices. Proc. IEEE 93 1330-1338. [Pg.402]


See other pages where IEEE-1394 devices is mentioned: [Pg.700]    [Pg.19]    [Pg.437]    [Pg.438]    [Pg.438]    [Pg.506]    [Pg.442]    [Pg.347]    [Pg.706]    [Pg.744]    [Pg.581]    [Pg.92]    [Pg.94]    [Pg.651]    [Pg.76]    [Pg.76]    [Pg.199]    [Pg.208]    [Pg.377]    [Pg.714]    [Pg.315]    [Pg.30]    [Pg.28]    [Pg.399]    [Pg.428]   
See also in sourсe #XX -- [ Pg.283 ]




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