HRTEM high-resolution transmission sample preparation

Samples, mounted on carbon or formvar coated copper grids, were examined by transmission electron microscopy (TEM) using a JEOL JEM200CX microscope operated at 200 KV. High resolution transmission electron microscopy (HRTEM) was performed by using a Hitachi 9000 UHR microscope operated at 300 kV. The sample grids were prepared by direct application of the aqueous... 

Several techniques are usually employed to study the strain in QD layers. Raman spectroscopy and high-resolution X-ray diffraction, on the one hand, can be routinely used to address this issue, but the data obtained are averaged over the entire volume of the dots. High-resolution transmission electron microscopy (HRTEM), on the other hand, provides information at the monolayer scale, but the technique requires extensive sample preparation that may induce an extra relaxation owing to thin foil effects the data gathered are local and may not reflect the structure of the whole sample. Medium energy ion scattering (MEIS) appears as an alternative no preparation is needed. 

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