High-temperature imaging probe

We will not discuss microscopy and structure determinations since special monographs are available. Let us mention, however, that hot stages are available these days which allow imaging and diffraction work to be done at high temperatures. The limits for high spatial resolution are often not set by the temperature but rather by the ambient atmospheres. For example, the electron probe beam requires vacuum, whereas the component chemical potentials of a sample are undefined in a vacuum. 

This entry is just an introduction there have been numerous other developments of advanced micro /nanofabrication techniques including ion-assisted CVD electron beam etching, for example, to produce nanopores [50] and custom AFM/ STM probes for scanning electrochemical imaging [51] and materials for sensing at high temperatures and in corrosive environments. 

Fig. 7 X-ray photoelectron spectrometer. Left schematic view of a SSX 100/206 (Surface Science Instruments). Right, photographs of a Kratos Axis Ultra (Kratos Analytical) with the introduction and intermediate chambers (top) and analysis chamber (bottom), a, Turbomolecular pump b, cryogenic pump c, introduction chamber d, sample analysis chamber (SAC) e, transfer probe f, automatized X, Y, Z manipulator g, X-ray monochromator h, electrostatic lens i, hemispherical analyzer (HSA) j, ion gun k, aluminum anode (with monochromator) 1, aluminum-magnesium twin anode m, detector. Left channel plate. Right 8 channeltrons (Spectroscopy mode), phosphor screen behind a channel plate with a video camera (Imaging mode) n, spherical mirror analyzer (SMA) o, parking facility in the sample transfer chamber p, sample cooling device for the introduction chamber q, sample transfer chamber r, monitor interconnected with the video camera viewing samples in the SAC s, video camera in the SAC t, high temperature gas ceU (catalyst pretreatment)...

It is possible to image the thermal pattern over a surface by having a thermocouple junction on the probe tip of an AFM the technique is called scanning thermal microscopy (SThM). Thermocouple junctions 100-500 nm in diameter have been produced that have a lOnm resolution (low to high temperature). By sending a thermal pulse through the substrate, differences in surface temperature may indicate poor thermal contact (i.e. poor adhesion). 

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