Grains atomic force microscopy

The lithium morphology at the beginning of the deposition was measured by in-situ atomic force microscopy (AFM) [42], When lithium was deposited at 0.6 C cm2, small particles 200-1000 nm in size were deposited on the thin lines and grain boundaries in LiC104-PC. Lump-like growth was observed in LiAsF6-PC along the line. 

Demanet CM, Sankar KV. Atomic force microscopy images of a pollen grain A preliminary study. S Afr JBot 1996 62 221—223. 

VanDerWelNN, PutmanCAJ, VanNoort SJT, DegrothBG, EmonsAMC. Atomic force microscopy of pollen grains, cellulose microfibrils and protoplasts. Protoplasma 1996 194 29-39. 

The substrate surface smoothness is critical to TFT performance. Device fabrication processes basically duplicate and/or worsen the surface roughness, which leads to smaller pentacene grains and results in deterioration of pentacene channel mobility. Atomic-force microscopy was used to characterize the surface roughness. Figure 15.21 shows an AFM image of our PET substrate surface before any process. The mean-square roughness and peak-to-valley roughness are 10 A and 90 A,... 

To make a local measurement of the photochemical activity of each grain, we used a well established probe reaction (the reduction of aqueous Ag+ to AgO) that deposits metallic silver on the surface as a reaction product [84-85]. The amount of silver deposited on each grain s surface during a given reaction, which is determined from atomic force microscopy (AFM) images, is taken to be a quantitative indicator of the grain s relative photochemical reactivity. The reactivity can then be correlated to surface orientation and/or the relative area of each facet on the surface. 

Characterization tools must also be developed if a fundamental understanding of corrosion is to be achieved. For example, observation of a titanium surface with an oxide film at the nanometer scale shows oxide grains on the surface. Conductivity atomic force microscopy measurements can be used to indicate defect-free Ti02 by showing no current flow. This is visually indicated by a dark image. 

Kelley, T.W. and Frisbie, C.D., Point contact current-voltage measurements on individual organic semiconductor grains by conducting probe atomic force microscopy,... 

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