Fine fourier analyses

Sayers, D.E. Lytle, F.W. and Stern, E. "New technique for investigating noncrystalline structures Fourier analysis of the extended X-ray absorption fine structure." Phys. Rev. Lett. 27 1204-1207 1971. 

Sayers DE, Stem EA, Lytle FW (1971) New technique for investigating nonciystalline structures Fourier analysis of the extended X-ray absorption fine stmeture. Phys Rev Lett 27 1204-1207 Schaefers F, Muller BR, Wong J, Tanaka T, Kamimura Y (1992) YBge a new soft X-ray monochromator crystal. Synchrotron Rad News 5[2] 28-30... 

Sayers DE, Hesterberg D, Zhou W, Robarge WP, Plummer GM (1997) XAFS characterization of copper contamination in the unsaturated and saturated zones of a soil profile. J de Physique IV 7 (Colloque C2, X-Ray Absorption Fine Structure, Vol. 2) 831-832 Sayers DE, Lytle FW, Stem EA (1972) Structure determination of amorphous germanium, germanium oxide, and germanium selenide by Fourier analysis of extended X-ray absorption fine structure (EXAFS). J Non-Crystal Solids 8-10 401-407... 

Sayers, D. E., E. A. Stem, and F. W. Lytle. 1971. New technique for investigating noncrystalline stmctures Fourier analysis of the extended X-Ray—absorption fine structure. Physical Review Letters 27, no. 18 1204. doi 10.1103/PhysRevLett.27.1204. 

Fig.6.7. Fourier analysis of hyper-fine-structure quantum beats in the ls2p P21 - Js2s Si decay of Be III [I(9Bei = 3/2] [6.36]...

Surface-extended X-ray absorption fine structure (analysis) spectroscopy Sum frequency generation Second harmonic generation Surface ionization Secondary ion mass spectroscopy Subtractively normalized interfacial Fourier transform infrared spectroscopy Single potential alteration infrared (spectroscopy)... 

Diffuse reflectance infrared Fourier transform spectroscopy deuterium triglycine sulphate energy compensated atom probe energy dispersive analysis energy-loss near edge structure electron probe X-ray microanalysis elastic recoil detection analysis (see also FreS) electron spectroscopy for chemical analysis extended energy-loss fine structure field emission gun focused ion beam field ion microscope... 

In the most simplistic means of defining particle shape, measurements may be classified as either macroscopic or microscopic methods. Macroscopic methods typically determine particle shape using shape coefficients or shape factors, which are often calculated from characteristic properties of the particle such as volume, surface area, and mean particle diameter. Microscopic methods define particle texture using fractals or Fourier transforms. Additionally electron microscopy and X-ray diffraction analysis have proved useful for shape analysis of fine particles. 

Mineralogical techniques such as X-ray diffraction, differential thermal analysis, Fourier transform infrared analysis, and Mossbauer spectroscopy may be useful for determining modes of occurrence of major elements in coal, but the ability of these techniques to determine the modes of occurrence of the minor- and trace-elements is quite limited. X-ray absorption-fine structure (XAFS) spectroscopy has been used to determine the modes of occurrence of several important minor and trace elements (e.g., arsenic and... 

Surface analytical techniques. A variety of spectroscopic methods have been used to characterize the nature of adsorbed species at the solid-water interface in natural and experimental systems (Brown et al, 1999). Surface spectroscopy techniques such as extended X-ray absorption fine structure spectroscopy (EXAFS) and attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR) have been used to characterize complexes of fission products, thorium, uranium, plutonium, and uranium sorbed onto silicates, goethite, clays, and microbes (Chisholm-Brause et al, 1992, 1994 Dent et al, 1992 Combes et al, 1992 Bargar et al, 2000 Brown and Sturchio, 2002). A recent overview of the theory and applications of synchrotron radiation to the analysis of the surfaces of soils, amorphous materials, rocks, and organic matter in low-temperature geochemistry and environmental science can be found in Fenter et al (2002). 

The change of the position of the particles affects the phases and thus the fine structure of the diffraction pattern. So the intensity in a certain point of the diffraction pattern fluctuates with time. The fluctuations can be analyzed in the time domain by a correlation function analysis or in the frequency domain by frequency analysis. Both methods are linked by Fourier transformation. 

According to the structure and composition of materials and analysis requirements of the researcher, the following analysis techniques can be selected for the characterization of mesoporous materials XRD, TEM, adsorption-desorption (N2 or other gas), solid MAS NMR (29Si, 27Al, 13C, etc.), scanning electron microscopy (SEM), catalysis test, Fourier Transform infra-red (FT-IR), thermal analysis, UV-visible, and chemical analysis. IR, X-ray photoelectron spectroscopy (XPS), X-ray absorption near-edge structure XANES, extended X-ray absorption fine structure EXAFS and other spectral methods are commonly used to analyse metal elements such as Ti in the mesoporous material frameworks. 

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