Extended energy- loss fine structure

Acronyms EXELFS (extended energy loss fine structure) 

Range of operation Incident electron energy is typically hundreds of keV. 

A conventional transmission electron microscope is required as well as an electron energy analyser to measure the electron energy loss spectra. It is often preferable to keep the energy of the detected electrons constant and to sweep the energy of incident electrons instead to improve signal to noise and energy resolution. 

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SEELFS (surface extended energy loss fine structure) yes 2 0.2... 

The occurrence of fine structures has already been noted in the sections on spectral information and ionization losses (Sects. 2.5.3 and 2.5.3.2). In the following text some principal considerations are made about the physical background and possible applications of both types of feature, i. e. near-edge and extended energy-loss fine structures (ELNES/EXELFS). A wealth of more detailed information on their usage is available, especially in textbooks [2.171, 2.173] and monographs [2.210-2.212]. 

Extended energy-loss fine structures (EXELES) are analogous to the EXAES effect observed in X-ray absorption [2.224, 2.225]. These weak modulations (cf Eig. 2.39a), still observable ca. 100 eV away from the edge onset, occur because the excited elec-... 

EXELFS (the extended energy-loss fine structure) carries information about the bonding and co-ordination of the atoms contributing to the edge. However, the signal needs to be strong before statistically reliable information can be obtained. 

Diffuse reflectance infrared Fourier transform spectroscopy deuterium triglycine sulphate energy compensated atom probe energy dispersive analysis energy-loss near edge structure electron probe X-ray microanalysis elastic recoil detection analysis (see also FreS) electron spectroscopy for chemical analysis extended energy-loss fine structure field emission gun focused ion beam field ion microscope... 

Surface Extended Energy Loss Fine Structure (SEELFS)... 

Figure 7.26. Electron energy-loss spectroscopy (EELS) spectra. Shown (top) is a representative EELS spectrum of a nickel oxide sample. A typical EELS spectrum shows a zero-loss peak that represents the unscattered or elastically scattered electrons, the near-edge fine structure (ELNES), and extended energy-loss fine structure (EXELFS). Also shown (bottom) are the fingerprint regions of an EELS spectrum, just beyond the core-electron edges, which provide information regarding the detailed bonding and chemical environment of the desired element.

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