Energy-dispersive x-ray mapping

Figure 5. Energy dispersive X-ray maps of cross sections of (a) failed and (b) integral epoxy-coated galvanized steel.

Figure 20 Energy-dispersive X-ray map showing distribution of grafted polyfvinyl phosphonate oligomerH/V-hydroxy-methylacrylamide) in fibrous cotton cellulose. Fibers were inunersed in water solution of oligomer and monomer then high-energy irradiation (a) fibrous cross-section as is (b) cross-section showing location of phosphorus in copolymer...

Local chemical composition from areas less than 1 nm in diameter can be measured by energy dispersive X-ray spectroscopy (EDS) or electron energy loss spectroscopy (EELS). Such spectroscopic information may be presented in 2D maps showing the spatial element distribution in the specimen (13). Furthermore, information about the local density of unoccupied electron states of a specific element can be extracted from EELS data and used to estimate the oxidation state and the local coordination geometry of the excited atoms (14). In some favorable cases, electronic structure information with a resolution of about 1 eV from individual atomic columns has been attained (15,16). Recent developments of monochromators and spectrometers have brought the resolution down to 0.1 eV (17,18), and this capability may offer new opportunities to determine relationships between electronic structure information, the atomic arrangements and the catalytic activities of solids. 

Figure 9-6 The scanning electron microscopy (SEM) in the backscattered mode, the energy dispersive X-ray (EDX) spectrum and X-ray distribution maps of a spherical particle from Sudbury soil showing Ni and Fe microstructures in a silicate matrix (from Adamo et al., 1996).

Figure 22 Si02 supported, MAO-activated zirconocene catalyst grains, Scanning Electron Microscopy (SEM) micrograph and element mapping by Energy-Dispersive X-ray Microanalysis.

The samples of the as-prepared silicon-doped titanium dioxide were examined by the energy-dispersive X-ray (EDX mapping) which was mounted on both the SEM and TEM. The results show that the silicon dopant is homogeneously distributed in the Ti02 matrix, either in the anatase or the rutile modifications. 

Figure 2. Backscattered electron image of Fust lignite (a), Ca X-ray map of the same area (b), and an energy-dispersive X-ray spectrum from an individual maceral (c).

Ion Imaging. A SIMS 1on Image represents the x-y distribution of a species over the surface of the sample. The usefulness of elemental Images has been Illustrated for Auger and electron microprobe energy dispersive X-ray (EDAX) maps SIMS... 

It is now possible to obtain scanning transmission electron microscopes (STEMs). With a STEM, the electrons pass through the specimen but, as in SEM, the electron optics focus the beam into a narrow spot that is scanned over the sample in a raster. This makes these microscopes suitable for analysis techniques such as mapping by energy dispersive X-ray (EDX) spectroscopy among others. Also, the resolution on the latest STEM instruments is less than one Angstrom. 

In this work, we report on the preliminary results from the fabrication and characterization of Ni-AbOs membranes. The effect of sintering temperatures on membrane support was investigated. The fabricated membranes were characterized by X-ray diffractometry (XRD), scanning electron microscopy (SEM), energy dispersive X-ray spectrometer including X-ray mapping (EDS). In addition, the pore size and porosity were determined by Hg porosimetry. 

After fabrication, the density of membrane was measured by dimension calculation. The crystalline phases of cermet membrane were investigated by using X-ray diffraction (XRD model JEOL, JDX-3530). Scanning electron microscope (SEM JEOL, JSM-6301F) was used to investigate the microstructure of Ni/AbOj membrane. For analysis of nickel dispersion of Ni/AbOj membrane, energy dispersive X-ray spectroscope (EDS Oxford Inca 300 and 350) with X-ray dot mapping was used. In addition, the pore size and porosity were determined by mercury porosimetry. 

IGC at elevated temperatures is a serious problem in the sulfidation of nickel alloys. Deep penetration can occur rapidly through the thickness of the alloy. This type of IGC can be evaluated by (i) X-ray mapping during examination by a scanning electron microscope equipped with an energy-dispersive X-ray detector and transmission electron microscopy (4). 

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