Emission spectroscopy, schematic

The simplest technique is the IR emission spectroscopy method, as presented schematically in Fig. 72. The method allows the successful investigation of aggressive molten materials and is generally applicable over a very wide range of temperatures and concentrations. 

A schematic diagram showing the disposition of these essential components for the different techniques is given in Fig. 21.3. The components included within the frame drawn in broken lines represent the apparatus required for flame emission spectroscopy. For atomic absorption spectroscopy and for atomic fluorescence spectroscopy there is the additional requirement of a resonance line source, In atomic absorption spectroscopy this source is placed in line with the detector, but in atomic fluorescence spectroscopy it is placed in a position at right angles to the detector as shown in the diagram. The essential components of the apparatus required for flame spectrophotometric techniques will be considered in detail in the following sections. 

Figure 1. The schematic diagram of the picosecond pulse radiolysis system for emission spectroscopy.

The most frequently applied analytical methods used for characterizing bulk and layered systems (wafers and layers for microelectronics see the example in the schematic on the right-hand side) are summarized in Figure 9.4. Besides mass spectrometric techniques there are a multitude of alternative powerful analytical techniques for characterizing such multi-layered systems. The analytical methods used for determining trace and ultratrace elements in, for example, high purity materials for microelectronic applications include AAS (atomic absorption spectrometry), XRF (X-ray fluorescence analysis), ICP-OES (optical emission spectroscopy with inductively coupled plasma), NAA (neutron activation analysis) and others. For the characterization of layered systems or for the determination of surface contamination, XPS (X-ray photon electron spectroscopy), SEM-EDX (secondary electron microscopy combined with energy disperse X-ray analysis) and... 

Fig. la c. Illustration of the time dependent theory of emission spectroscopy for one-dimensional harmonic potential energy surfaces, a schematic view of the emission transition, b time dependence of the overlap < (f> t) >, e calculated emission spectrum... 

Fig. 1. Schematic view of the 3D experimental data collected in Time-Resolved Emission Spectroscopy.

Fig. 5. The schematic diagram of the pulsing system and the ion beam pulse radiolysis system with an optical emission spectroscopy. PMT denotes photomultiplier tube HV, high voltage supply CFD, constant fraction discriminator TAC, time to amplitude converter and PH A, pulse height analyzer. From Ref. 36...

Fig. 10. Photograph and schematic representation of high-pressure Mossbauer emission spectroscopy cell 24).

Atomic emission spectroscopy is applied to the measurement of light emitted by thermal energy caused by the thermal source from the chemical species present. Examples of emission, absorption and fluorescence spectroscopy can be shown schematically, as in Figure 1.5. 

Figure 11.15 Schematic diagram of an inductively coupled plasma located within its torch, as employed in atomic emission spectroscopy. From Dean, J. R., Atomic Absorption and Plasma Spectroscopy, ACOL Series, 2nd Edn, Wiley, Chichester, UK, 1997. Reproduced with permission of the University of Greenwich.

Atomic emission spectroscopy is very similarly to atomic absorption spectroscopy. The difference between these methods can be seen from their names. Emitted light of the atom under analysis is analyzed by atom emission spectroscopy. The schematic for the atomic emission spectrometer is very similar to that for atomic absorption spectrometer. The schematic for the atomic emission spectrometer is presented in Figure 2.58. 

Fig. 12.27 Schematic diagram of a discharge cell for RF-glow discharge atomic emission spectroscopy.

FIGURE 21.10 Schematic drawing of an emission spectroscopy analyzer, typically used to measure nitrogen concentrations. The output varies with the pressure within the ionization chamber, so the ne e valve and vacuum pump must carefully regulate that pressure. 

Figure 7.7 (a) Diagram of a direct current arc source. The solid sample is packed into the cupped end of the lower graphite electrode. The graphite counterelectrode is also shown. (From Hareland, W., Atomic emission spectroscopy, in Ewing, G.W. ed.. Analytical Instrumentation Handbook, 2nd edn., Marcel Dekker, Inc., New York, 1997. With permission.) (b) A schematic of the lower electrode used to hold the sample. 

Platinum y — Type 304 SS Fig. 5 Schematic of the electrochemical emission spectroscopy system [35]. 

A simple cell for liquids is schematically shown in Figure 5.4, developed by Guo et al. [11]. This liquid cell consists of a metal container, an O-ring, and a 100-nm-thin SijN membrane (1x1 mm size). Liquid samples are sealed inside the metal container with O ring and the SijN membrane. The cell is then transferred into the UHV chamber at the beam line to allow access to soft X-rays. The SijN membrane enables photon-in and photon-out so that the absorption signal is measured with fluorescence yield. This also permits X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS) [1], which are not discussed here. 

Fig. 14.10 Schematic of modular components for emission spectroscopy. The standard fluorimeter arrangement is a Xe arc lamp as source single grating monochromators for excitation and emission selection and analogue or photon counting PMT as detector...

Fig. 1.24. Schematic diagram of sampling arrangement for FTIR emission spectroscopy. After Rintoul et ai [109]. From L. Rintoul et al. Analyst 123, 571-577 (1998). Reproduced by permission of The Royal Society of Chemistry.

Figure 25.8 Schematic diagram showing inductively coupled plasma used for optical emission spectroscopy.

Fig. 3.19 Schematic illustration of the measurement geometry for Mossbauer spectrometers. In transmission geometry, the absorber (sample) is between the nuclear source of 14.4 keV y-rays (normally Co/Rh) and the detector. The peaks are negative features and the absorber should be thin with respect to absorption of the y-rays to minimize nonlinear effects. In emission (backscatter) Mossbauer spectroscopy, the radiation source and detector are on the same side of the sample. The peaks are positive features, corresponding to recoilless emission of 14.4 keV y-rays and conversion X-rays and electrons. For both measurement geometries Mossbauer spectra are counts per channel as a function of the Doppler velocity (normally in units of mm s relative to the mid-point of the spectrum of a-Fe in the case of Fe Mossbauer spectroscopy). MIMOS II operates in backscattering geometry circle), but the internal reference channel works in transmission mode...

Fig. 2.3. Schematic illustration of the mechanisms of electron and x-ray generation in x-ray emission, ESCA, and Auger spectroscopies (after Urch, 1971, reproduced with the publisher s permission).

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