Electronic characterization techniques valence-shell electrons

Some simple rules were supported by empirial evidence, valence shell electron pair repulsion model (VSEPR) and MO calculations, both semiempirical and ab initio. These rules could explain those features of molecular geometry which have been characterized by structural investigations using spectroscopic and diffraction techniques. 

Further analysis is based on the idea that the characteristic experimental behavior of different classes of compounds and the suitability of those or other models used to describe this behavior is ultimately related to the extent to which the chromophores or electron groups physically present in the molecular system are reflected in these models. It is easy to notice, that the MM methods work well in case of molecules with local bonds designated in Table 1 as valence bonds the QC methods apply both to the valence bonded systems, and for the systems with delocalized bonds (referred as orbital bonds in Table 1). The TMCs of interest, however, not covered either by MM or by standard QC techniques can be physically characterized as those bearing the d-shell chromophore. The magnetic and optical properties characteristic for TMCs are related to d- or /-states of metal ions. The basic features in the electronic structure of TMCs of interest, distinguishing these compounds from others are the following ... 

In addition to using X-rays to irradiate a surface, ultraviolet light may be used as the source for photoelectron spectroscopy (PES). This technique, known as ultraviolet photoelectron spectroscopy (UPS, Figure 7.38), is usually carried out using two He lines (Hel at 21.2 eV and Hell at 40.8 eV), or a synchrotron source. This technique is often referred to as soft PES, since the low photon energy is not sufficient to excite the inner-shell electrons, but rather results in photoelectron emission from valence band electrons - useful to characterize surface species based on their bonding motifs. It should be noted that both UPS and XPS are often performed in tandem with an Ar" " source, allowing for chemical analysis of the sample at depths of < 1 J,m below the surface. 

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