Electron probe micro-analyzer

Orientation imaging microscopy (OIM) maps were obtained from electron backscattering diffraction pattern (EBSP) using JEOL JXA8100 electron probe micro-analyzer with OIM software provided by TexSEM Lab., Inc. 

Several plagioclase grains from annealed samples as well as shock-loaded run products were embedded in epoxy resin and polished. Observation was performed with an optical microscope using reflected and transmitted light. Major and minor element compositions were determined by an electron probe micro-analyzer. Shock textures were also examined in detail with a scanning electron microscope using back-scattered electron images. 

In the next tests, test specimens of the diffusion welding will be manufactured and tensile and creep strength will be obtained. The Electron Probe Micro Analyzer analysis will be also conducted to investigate inclusions in the diffusion welding. 

Some of the techniques described in this chapter used most widely today are Auger electron spectroscopy, X-ray photoelectron spectroscopy, electron-probe micro-analysis, low energy electron diffraction, scanning electron microscope, ion scattering spectroscopy, and secondary ion mass spectroscopy. The solid surface, after liberation of electrons, can be analyzed directly by AES, XPS, ISS, and EPMA (nondestructive techniques), or by liberation of ions from surfaces using SIMS (involving the destruction of the surface). Apart from the surface techniques, reflectance-absorbance infrared (RAIR) spectroscopy has also been employed for film characterization (Lindsay et al., 1993 Yin et al., 1993). Some... 

WDS is another technique utilized for elemental chemical analysis in reverse engineering. EDXA and WDS are usually used in conjunction with SEM, or an electron probe microanalyzer (EPMA). EPMA is a nondestructive elemental analysis technique, similar to SEM but with a more focused analysis area. It works by rastering a micro volume of the sample with an electron beam typical of an energy level of 5 to 30 keV. It then collects the induced X-ray photons emitted by the various elemental species and quantitatively analyzes the spectrum with precise accuracy, up to ppm. In contrast to EDXA, WDS analyzes the electron diffraction patterns based on Bragg s law and has a much finer spectral resolution and better accuracy. WDS also avoids the problems associated with artifacts in EDXA, such as the false peaks and the background noise from the amplifiers. The noise intensity that appears in... 

Electron beams can be used for the probe which can analyze the micro portions of the sample s surface, ranging from nanometer to micrometer scales, because the electron beams can be easily narrowed by using the magnetic field. The infiltrated depth of the electron beams is usually smaller than that of the X-rays, suggesting that the electron beam analyses should be one of the best methods for surface analyses. 

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