Electron microscopy applications

The method has been thoroughly analyzed in the electron microscopy application by Ferwerda and colleagues [see references cited by Van Toom and Ferwerda (1977)]. Convergence properties, uniqueness of solutions, and... 

The coherent emission property has recently been demonstrated and utilized to produce electron holography images [173]. This is an important result since the coherence was much higher than from standard tungsten tips so that nanotube tips may replace tungsten tips in high resolution electron microscopy applications. 

Thornton, P. R., (1968), Scanning Electron Microscopy, Applications to Materials and Device Science, Chapman and Hall, London. 

Clement, F. Lapra, A. Bokobza, L. Monnerie, L. Menez, P., Atomic Force Microscopy Investigation of Filled Elastomers and Comparison with Transmission Electron Microscopy—Application to Silica-Filled Silicone Elastomers. Polymer 2001,42, 6259-6270. 

Zuo JM, Mahon JC (2004) Web-based electron microscopy application software web-EMAPS. Microsc Microanal 10 1000-1001. doi 10.1017/S1431927604884319... 

Biswas P., Atta-Fynn R., Chakraborty S., and Drabold D. A., Real space information from fluctuation electron microscopy applications to amorphous silicon,/. Phys. Condens. Matter, 19,455202 (9 p.) (2007). 

Electron microscopy applications 17,2 theory 77, 1 Electrophoresis use in virus research 77, 1 Enteroviruses structure 6, 5 Erythrocyte membrane structure in relation to viral hemagglutinin 76, 1... 

Clement F, Lapra A, Bokobza L, Monnerie L and M6nez P (2001) Atomic force microscopy investigation of filled elastomers and compaiison with transmission electron microscopy - application to silica-filled elastomers. Polymer 42 6259-6270. 

Suh Y J, Prikhodko S V and Fi iedlander S K (2002) Nanostructure Manipulation Device for Transmission Electron Microscopy Application to Titania Nanoparticle Chain Aggregates, Microsc Microanal 8 497-501. 

A.I. Medalia. Morphology of aggregates. VI. Effective volume of aggregates of carbon black from electron microscopy application to vehicle absorption and to die swell of filler rubber. /. Colloid Interface Sci., 32,115-131,1970. 

Transmission electron microscopy (TEM) can resolve features down to about 1 nm and allows the use of electron diffraction to characterize the structure. Since electrons must pass through the sample however, the technique is limited to thin films. One cryoelectron microscopic study of fatty-acid Langmuir films on vitrified water [13] showed faceted crystals. The application of TEM to Langmuir-Blodgett films is discussed in Chapter XV. 

P. R. Thornton, Scanning Electron Microscopy, Chapman and Hall, 1968. See also Scanning Electron Microscopy Systems and Applications, The Institute of Physics, London, 1973. 

For bulk structural detemiination (see chapter B 1.9). the main teclmique used has been x-ray diffraction (XRD). Several other teclmiques are also available for more specialized applications, including electron diffraction (ED) for thin film structures and gas-phase molecules neutron diffraction (ND) and nuclear magnetic resonance (NMR) for magnetic studies (see chapter B1.12 and chapter B1.13) x-ray absorption fine structure (XAFS) for local structures in small or unstable samples and other spectroscopies to examine local structures in molecules. Electron microscopy also plays an important role, primarily tlirough unaging (see chapter B1.17). 

E. Lifshin. Scanning Electron Microscopy and X-Ray Analysis. Plenum Press, New York, 1981. Developed from a short course held aimually at Lehigh University. The book is concerned with the use and applications of SEM. In the latter context a lengthy discussion of EDS is given. The discussion... 

D. B. Williams. Practical Analytical Electron Microscopy in Materials Science. Verlag Chemie International, Weinheim, 1984. A good monograph discussing the use and applications of AEM, especially at intermediate voltages. The discussion on EDS is an excellent primer for using X-ray analysis on a TEM. 

Cathodoluminescence (CL), i.e., the emission of light as the result of electron-beam bombardment, was first reported in the middle of the nineteenth century in experiments in evacuated glass tubes. The tubes were found to emit light when an electron beam (cathode ray) struck the glass, and subsequendy this phenomenon led to the discovery of the electron. Currendy, cathodoluminescence is widely used in cathode-ray tube-based (CRT) instruments (e.g., oscilloscopes, television and computer terminals) and in electron microscope fluorescent screens. With the developments of electron microscopy techniques (see the articles on SEM, STEM and TEM) in the last several decades, CL microscopy and spectroscopy have emerged as powerfirl tools for the microcharacterization of the electronic propenies of luminescent materials, attaining spatial resolutions on the order of 1 pm and less. Major applications of CL analysis techniques include ... 

A. J. Bevolo. Scanning Electron Microscopy. 1985, vol. 4, p. 1449. (Scanning Electron Microscopy, Inc. Elk Grove Village, IL) Thorough exposition of the principles and applications of reflected electron energy-loss microscopy (REELM) as well as a comparison to other techniques, such as SAM, EDS and SEM. 

Botz et al. (29) also demonstrated, by scanning electron microscopy, that application of overpressure increases the density of the layer, which could be one reason for the higher separation efficiency. These results showed that Empore silica TLC sheets enable extremely rapid separations (5-20 min) in one-dimensional OPLC, and gave good resolution. Theoretically, for a 3-D OPLC separations development times of 15-60 min would be required. The separation cube of sheets could be especially useful for micropreparative separations (30). 

The core structure of the 1/2 [112] dislocation is shown in Fig. 4. This core is spread into two adjacent (111) plames amd the superlattice extrinsic stacking fault (SESF) is formed within the core. Such faults have, indeed, been observed earlier by electron microscopy (Hug, et al. 1986) and the recent HREM observation by Inkson amd Humphreys (1995) can be interpreted as the dissociation shown in Fig. 4. This fault represents a microtwin, two atomic layers wide, amd it may serve as a nucleus for twinning. Application of the corresponding external shear stress, indeed, led at high enough stresses to the growth of the twin in the [111] direction. 

Aluminium is widely applied for decorative and protective requirements, while cadmium , zinc and titanium have been applied to ferrous materials chiefly for their protective value. The method finds particular application in the plating of high-tensile steels used in aviation and rocketry, car fittings and lamp reflectors, and gramophone record master discs, as well as in the preparation of specimens for electron microscopy and in rendering insulated surfaces electrically conducting, e.g. metallising of capacitors and resistors. 

To ensure quality control material suppliers and developers routinely measure such complex properties as molecular weight and its distribution, crystallinity and crystalline lattice geometry, and detailed fracture characteristics (Chapter 6). They use complex, specialized tests such as gel permeation chromatography (2, 3), wide- and narrow-angle X-ray diffraction, scanning electron microscopy, and high-temperature pressurized solvent reaction tests to develop new polymers and plastics applications. 

Boggs, J.L. Prentice, K.J. Kraeutle J.E. Crump, The Role of the Scanning Electron Microscope in the Study of Solid Propellant Combustion , inavwepsceiiu ir h/zo yiyoy) do) u,u, Graber, F.C. Rauch A.J. Fanelli, Observation of Solid-Solid Polymorphic Transformation in 2,4,6-Trinitro Toluene , JPhChem 73, (10), 3514—15 (1969) 39) J.E. Crump, J.L. Prentice K.J. Kraeutle Role of Scanning Electron Microscopy in the Study of Solid Propellant Combustion. Part 11—Behavior of Metal Additives , NavWepsCentr TP-5142-PT-2 (1969) 40) J.A. Markham A.R. Cox, Applications... 

Electron microscopy, 163-164 Electro-optic applications, polyimide, 269 Electrophilic aromatic substitution, 329-334, 398... 

Further structural information is available from physical methods of surface analysis such as scanning electron microscopy (SEM), X-ray photoelectron or Auger electron spectroscopy (XPS), or secondary-ion mass spectrometry (SIMS), and transmission or reflectance IR and UV/VIS spectroscopy. The application of both electroanalytical and surface spectroscopic methods has been thoroughly reviewed and appropriate methods are given in most of the references of this chapter. 

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