Electron ionization mass analyzers

Two isomeric complexes, 60 and 61, have been analyzed by Cl MS (reagent gas CH4), producing [M -b I] and [M -b 29]+ ions. Electron ionization mass spectrometry was applied in the analysis of the product of the reaction between Zn(CF3)Br-2CH3CN (62) and 4-(Af,Af-dimethylamino)pyridine (DMAP). The El (20 eV) mass spectrum of the product, Zn(CF3)Br DMAP (63), was recorded at 280 °C and consisted mainly of [C6H3BrF2NZn]+, [ZnBr2]+ and [ZnBr]+ ions. At lower temperatures, this compound did not yield any Zn-containing ions, and the spectra were dominated by the peaks of the [DMAPJ+ and [C2HgN]+ ions . 

SNMS Spullered Neutral Mass Spectroscopy Surface, bulk Plasma discharge noble gases 0.5-20 keV Sputtered atoms ionized by atoms or electrons then mass analyzed 0.1-0.6 nm (or deeper Ion milling) 1 cm Elemental analysis Z > 3 depth prolile deleclion limit ppm 4,6... 

The TOE mass analyzer determines the mass of biomolecular samples according to the time required for the ions to travel from the ion source to the detector. It is the most simple and robust mass analyzer, and has practically unlimited mass range. It has a pulsed mode of operation. Because MALDI generates ions in short, nanosecond pulses, TOP analysis works very well with MALDI. TOP analyzers have also been applied to ESI and gas chromatography electron ionization mass spectrometry (GC-MS). 

Peng, X. Kong, W. Zero Energy Kinetic Electron and Mass-Analyzed Threshold Ionization Spectroscopy of NaxfNHs) (n=l,2,and 4) Complexes. J. Chem. Phys. 2002,117,9306-9315. 

This chapter should be read in conjunction with Chapter 3, Electron Ionization. In electron ionization (El), a high vacuum (low pressure), typically 10 mbar, is maintained in the ion source so that any molecular ions (M +) formed initially from the interaction of an electron beam and molecules (M) do not collide with any other molecules before being expelled from the ion source into the mass spectrometer analyzer (see Chapters 24 through 27, which deal with ion optics). 

Much of the energy deposited in a sample by a laser pulse or beam ablates as neutral material and not ions. Ordinarily, the neutral substances are simply pumped away, and the ions are analyzed by the mass spectrometer. To increase the number of ions formed, there is often a second ion source to produce ions from the neutral materials, thereby enhancing the total ion yield. This secondary or additional mode of ionization can be effected by electrons (electron ionization, El), reagent gases (chemical ionization. Cl), a plasma torch, or even a second laser pulse. The additional ionization is often organized as a pulse (electrons, reagent gas, or laser) that follows very shortly after the... 

If a sample solution is introduced into the center of the plasma, the constituent molecules are bombarded by the energetic atoms, ions, electrons, and even photons from the plasma itself. Under these vigorous conditions, sample molecules are both ionized and fragmented repeatedly until only their constituent elemental atoms or ions survive. The ions are drawn off into a mass analyzer for measurement of abundances and mJz values. Plasma torches provide a powerful method for introducing and ionizing a wide range of sample types into a mass spectrometer (inductively coupled plasma mass spectrometry, ICP/MS). 

As each mixture component elutes and appears in the ion source, it is normally ionized either by an electron beam (see Chapter 3, Electron Ionization ) or by a reagent gas (see Chapter I, Chemical Ionization ), and the resulting ions are analyzed by the mass spectrometer to give a mass spectmm (Figure 36.4). 

It is worth noting that some of these methods are both an inlet system to the mass spectrometer and an ion source at the same time and are not used with conventional ion sources. Thus, with electrospray, the process of removing the liquid phase from the column eluant also produces ions of any emerging mixture components, and these are passed straight to the mass spectrometer analyzer no separate ion source is needed. The particle beam method is different in that the liquid phase is removed, and any residual mixture components are passed into a conventional ion source (often electron ionization). 

The previous discussion has centered on how to obtain as much molecular mass and chemical structure information as possible from a given sample. However, there are many uses of mass spectrometry where precise isotope ratios are needed and total molecular mass information is unimportant. For accurate measurement of isotope ratio, the sample can be vaporized and then directed into a plasma torch. The sample can be a gas or a solution that is vaporized to form an aerosol, or it can be a solid that is vaporized to an aerosol by laser ablation. Whatever method is used to vaporize the sample, it is then swept into the flame of a plasma torch. Operating at temperatures of about 5000 K and containing large numbers of gas ions and electrons, the plasma completely fragments all substances into ionized atoms within a few milliseconds. The ionized atoms are then passed into a mass analyzer for measurement of their atomic mass and abundance of isotopes. Even intractable substances such as glass, ceramics, rock, and bone can be examined directly by this technique. 

In a high vacuum (low pressure 10 mbar), molecules and electrons interact to form ions (electron ionization, El). These ions are usually injected into the mass spectrometer analyzer section. 

The beam of substrate molecules then passes straight into the ion source (electron ionization, El, or chemical ionization. Cl) for ionization before entry into the mass analyzer. 

Laser ionization mass spectrometry or laser microprobing (LIMS) is a microanalyt-ical technique used to rapidly characterize the elemental and, sometimes, molecular composition of materials. It is based on the ability of short high-power laser pulses (-10 ns) to produce ions from solids. The ions formed in these brief pulses are analyzed using a time-of-flight mass spectrometer. The quasi-simultaneous collection of all ion masses allows the survey analysis of unknown materials. The main applications of LIMS are in failure analysis, where chemical differences between a contaminated sample and a control need to be rapidly assessed. The ability to focus the laser beam to a diameter of approximately 1 mm permits the application of this technique to the characterization of small features, for example, in integrated circuits. The LIMS detection limits for many elements are close to 10 at/cm, which makes this technique considerably more sensitive than other survey microan-alytical techniques, such as Auger Electron Spectroscopy (AES) or Electron Probe Microanalysis (EPMA). Additionally, LIMS can be used to analyze insulating sam-... 

In both electron post-ionization techniques mass analysis is performed by means of a quadrupole mass analyzer (Sect. 3.1.2.2), and pulse counting by means of a dynode multiplier. In contrast with a magnetic sector field, a quadrupole enables swift switching between mass settings, thus enabling continuous data acquisition for many elements even at high sputter rates within thin layers. 

Figure 2.1 Mass spectrometric approach. Dl, direct inlet GC, gas chromatography HPLC, high performance liquid chromatography CZE, capillary zone electrophoresis El, electron ionization Cl, chemical ionization ESI, electrospray ionization DESI, desorption electrospray ionization APCI, atmospheric pressure chemical ionization MALDI, matrix assisted laser desorption ionization B, magnetic analyzer E, electrostatic analyzer...

In the past decade, as systems have become simpler to operate, mass spectrometry (MS) has become increasingly popular as a detector for GC. Of all detectors for GC, mass spectrometry, often termed mass selective detector (MSD) in bench-top systems, offers the most versatile combination of sensitivity and selectivity. The fundamentals of MS are discussed elsewhere in this text. Quadrupole (and ion trap, which is a variant of quadrupole) mass analyzers, with electron impact ionization are by far (over 95%) the most commonly used with GC. They offer the benefits of simplicity, small size, rapid scanning of the entire mass range and sensitivity that make an ideal detector for GC. 

---