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Diffraction defined

It is interesting to compare this result with (2.14) which assumes long range order whereas (2.24) does not. One cannot expect 2.25 with a=0 to correspond to (2.14) with u=0 as we have employed an approximation to obtain (2.15). For finite values of a and u, the most obvious difference in behaviour between the functions in (2.14) and (2.25) is the fact that all orders of diffraction defined by the latter equation are widened as well as being decreased in magnitude by the exponential factor and that this widening increases rapidly as one proceeds to higher orders of diffraction. [Pg.22]

Modern methods of amino-acid and peptide analysis, have enabled the complete amino-acid sequence of a number of proteins to be worked out. The grosser structure can be determined by X-ray diffraction procedures. Proteins have molecular weights ranging from about 6 000 000 to 5 000 (although the dividing line between a protein and a peptide is ill defined). Edible proteins can be produced from petroleum and nutrients under fermentation. [Pg.332]

Segregation of bearings, with regard to residual austenite was performed with the aid of WIROTEST 202 and WIROTEST 12 finish. Selected rings with defined indications were subject to metalographic tests, in order to state whether residual austenite occurs, and then using the diffraction method, the percentage content of residual austenite. [Pg.24]

We need to point out that, if the wavelengths of laser radiation are less than the size of typical structures on the optical element, the Fresnel model gives a satisfactory approximation for the diffraction of the wave on a flat optical element If we have to work with super-high resolution e-beam generators when the size of a typical structure on the element is less than the wavelengths, in principle, we need to use the Maxwell equations. Now, the calculation of direct problems of diffraction, using the Maxwell equations, are used only in cases when the element has special symmetry (for example circular symmetry). As a rule, the purpose of this calculation in this case is to define the boundary of the Fresnel model approximation. In common cases, the calculation of the diffraction using the Maxwell equation is an extremely complicated problem, even if we use a super computer. [Pg.265]

In general, anions are less strongly hydrated than cations, but recent neutron diffraction data have indicated that even around the halide ions there is a well defined primary hydration shell of water molecules, which, in... [Pg.567]

In LEED experunents, the matrix M is detennined by visual inspection of the diffraction pattern, thereby defining the periodicity of the surface structure the relationship between surface lattice and diffraction pattern will be described in more detail in the next section. [Pg.1764]

In this section, we concentrate on the relationship between diffraction pattern and surface lattice [5], In direct analogy with the tln-ee-dimensional bulk case, the surface lattice is defined by two vectors a and b parallel to the surface (defined already above), subtended by an angle y a and b together specify one unit cell, as illustrated in figure B1.21.4. Withm that unit cell atoms are arranged according to a basis, which is the list of atomic coordinates within drat unit cell we need not know these positions for the purposes of this discussion. Note that this unit cell can be viewed as being infinitely deep in the third dimension (perpendicular to the surface), so as to include all atoms below the surface to arbitrary depth. [Pg.1767]

The first analytical tool to assess tire quality of a zeolite is powder x-ray diffraction. A collection of simulated powder XRD patterns of zeolites and some disordered intergrowths togetlier witli crystallographic data is available from tlie IZA [4o]. Phase purity and x-ray crystallinity, which is arbitrarily defined as tlie ratio of tlie intensity of... [Pg.2787]

Figure C2.17.8. Powder x-ray diffraction (PXRD) from amoriDhous and nanocry stalline Ti02 nanocrystals. Powder x-ray diffraction is an important test for nanocrystal quality. In the top panel, nanoparticles of titania provide no crystalline reflections. These samples, while showing some evidence of crystallinity in TEM, have a major amoriDhous component. A similar reaction, perfonned with a crystallizing agent at high temperature, provides well defined reflections which allow the anatase phase to be clearly identified. Figure C2.17.8. Powder x-ray diffraction (PXRD) from amoriDhous and nanocry stalline Ti02 nanocrystals. Powder x-ray diffraction is an important test for nanocrystal quality. In the top panel, nanoparticles of titania provide no crystalline reflections. These samples, while showing some evidence of crystallinity in TEM, have a major amoriDhous component. A similar reaction, perfonned with a crystallizing agent at high temperature, provides well defined reflections which allow the anatase phase to be clearly identified.
Steinhauer and Gasteiger [30] developed a new 3D descriptor based on the idea of radial distribution functions (RDFs), which is well known in physics and physico-chemistry in general and in X-ray diffraction in particular [31], The radial distribution function code (RDF code) is closely related to the 3D-MoRSE code. The RDF code is calculated by Eq. (25), where/is a scaling factor, N is the number of atoms in the molecule, p/ and pj are properties of the atoms i and/ B is a smoothing parameter, and Tij is the distance between the atoms i and j g(r) is usually calculated at a number of discrete points within defined intervals [32, 33]. [Pg.415]

Because there are two changes ia material composition near the active region, this represents a double heterojunction. Also shown ia Figure 12 is a stripe geometry that confines the current ia the direction parallel to the length of the junction. This further reduces the power threshold and makes the diffraction-limited spreading of the beam more symmetric. The stripe is often defined by implantation of protons, which reduces the electrical conductivity ia the implanted regions. Many different stmctures for semiconductor diode lasers have been developed. [Pg.10]

Amorphous silica, ie, silicon dioxide [7631-86-9] Si02, does not have a crystalline stmcture as defined by x-ray diffraction measurements. Amorphous silica, which can be naturally occurring or synthetic, can be either surface-hydrated or anhydrous. Synthetic amorphous silica can be broadly divided into two categories of stable materials (1) vitreous silica or glass (qv), which is made by fusing quart2 at temperatures greater than approximately 1700°C (see Silica, vitreous silica), and microamorphous silica, which is discussed herein. [Pg.483]

Cane sugar is generally available ia one of two forms crystalline solid or aqueous solution, and occasionally ia an amorphous or microcrystalline glassy form. Microcrystalline is here defined as crystals too small to show stmcture on x-ray diffraction. The melting poiat of sucrose (anhydrous) is usually stated as 186°C, although, because this property depends on the purity of the sucrose crystal, values up to 192°C have been reported. Sucrose crystallines as an anhydrous, monoclinic crystal, belonging to space group P2 (2). [Pg.13]

Clays are composed of extremely fine particles of clay minerals which are layer-type aluminum siUcates containing stmctural hydroxyl groups. In some clays, iron or magnesium substitutes for aluminum in the lattice, and alkahes and alkaline earths may be essential constituents in others. Clays may also contain varying amounts of nonclay minerals such as quart2 [14808-60-7] calcite [13397-26-7] feldspar [68476-25-5] and pyrite [1309-36-0]. Clay particles generally give well-defined x-ray diffraction patterns from which the mineral composition can readily be deterrnined. [Pg.204]

Each diffracted beam, which is recorded as a spot on the film, is defined by three properties the amplitude, which we can measure from the intensity of the spot the wavelength, which is set by the x-ray source and the phase, which is lost in x-ray experiments (Figure 18.8). We need to know all three properties for all of the diffracted beams to determine the position of the atoms giving rise to the diffracted beams. How do we find the phases of the diffracted beams This is the so-called phase problem in x-ray crystallography. [Pg.379]

Figure 18.8 Two diffracted beams (purple and orange), each of which is defined by three properties amplitude, which is a measure of the strength of the beam and which is proportional to the intensity of the recorded spot phase, which is related to its interference, positive or negative, with other beams and wavelength, which is set by the x-ray source for monochromatic radiation. Figure 18.8 Two diffracted beams (purple and orange), each of which is defined by three properties amplitude, which is a measure of the strength of the beam and which is proportional to the intensity of the recorded spot phase, which is related to its interference, positive or negative, with other beams and wavelength, which is set by the x-ray source for monochromatic radiation.
Diffraction is usefiil whenever there is a distinct phase relationship between scattering units. The greater the order, the better defined are the diffraction features. For example, the reciprocal lattice of a 3D crystal is a set of points, because three Laue conditions have to be exactly satisfied. The diffraction pattern is a set of sharp spots. If disorder is introduced into the structure, the spots broaden and weaken. Two-dimensional structures give diffraction rods, because only two Laue conditions have to be satisfied. The diffraction pattern is again a set of sharp spots, because the Ewald sphere cuts these rods at precise places. Disorder in the plane broadens the rods and, hence, the diffraction spots in x and y. The existence of streaks, broad spots, and additional diffuse intensity in the pattern is a common... [Pg.259]


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See also in sourсe #XX -- [ Pg.5 , Pg.208 ]

See also in sourсe #XX -- [ Pg.486 ]

See also in sourсe #XX -- [ Pg.5 , Pg.208 ]

See also in sourсe #XX -- [ Pg.220 ]




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Diffraction methods defining

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