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Parallel-plate capacitor

Figure Bl.6.2 Electron analysers consisting of a pair of capacitor plates of various configurations (a) the parallel-plate analyser, (b) the 127° cylindrical analyser and (c) the 180° spherical analyser. Trajectories for electrons of different energies are shown. Figure Bl.6.2 Electron analysers consisting of a pair of capacitor plates of various configurations (a) the parallel-plate analyser, (b) the 127° cylindrical analyser and (c) the 180° spherical analyser. Trajectories for electrons of different energies are shown.
Wlien an electrical coimection is made between two metal surfaces, a contact potential difference arises from the transfer of electrons from the metal of lower work function to the second metal until their Femii levels line up. The difference in contact potential between the two metals is just equal to the difference in their respective work fiinctions. In the absence of an applied emf, there is electric field between two parallel metal plates arranged as a capacitor. If a potential is applied, the field can be eliminated and at this point tire potential equals the contact potential difference of tlie two metal plates. If one plate of known work fiinction is used as a reference electrode, the work function of the second plate can be detennined by measuring tliis applied potential between the plates [ ]. One can detemiine the zero-electric-field condition between the two parallel plates by measuring directly the tendency for charge to flow through the external circuit. This is called the static capacitor method [59]. [Pg.1894]

For this purpose we compare a parallel plate capacitor under vacuum and one containing a dielectric, as shown in Figs. 10.4a and b, respectively. The plates of the capacitor carry equal but opposite charges Q which can be described as aA, where o is the surface charge density and A is the area of the plates. In this case, the field between the plates is given by... [Pg.666]

Figure 10.4 Parallel-plate capacitor with surface charge density a. (a) The field is Eo with no dielectric present, (b) The field is reduced to E by a dielectric which acquires a surface charge of its own,... Figure 10.4 Parallel-plate capacitor with surface charge density a. (a) The field is Eo with no dielectric present, (b) The field is reduced to E by a dielectric which acquires a surface charge of its own,...
Consider the leaky parallel plate capacitor shown in Figure A-4-1.3. If the capacitor is momentarily charged and allowed to discharge through resistor / L, so that the charging current Iq = 0, the leakage current... [Pg.14]

Erom C-1.1 the equation for capacitance of a parallel plate capacitor (plate area A, separation d) s ... [Pg.14]

A simple model of the e.d.l. was first suggested by Helmholz in which the charges at the interface were regarded as the two plates constituting a parallel plate capacitor, e.g. a plate of metal with excess electrons (the inner Helmholz plane I.H.P.) and a plate of excess positively charged ions (the outer Helmholz plane O.H.P.) in the solution adjacent to the metal the... [Pg.1168]

The simple Helmholz model, in which the charge on the model is regarded as the plate of a capacitor that attracts a counter layer of ions of opposite charge and results in two parallel plates of the same charge density, is inconsistent with the shapes of the electrocapillary curves obtained in practice. It can be shownthat if the Helmholz model applied, the electrocapillary curve would conform to the relationship... [Pg.1177]

Capacitive Sensors. This device usually consists of a capacitor which is formed either from two concentric cylinders or from a pair of parallel plates. The solid sample to be analyzed for moisture content is passed between these plates. Since w has a large dielectric constant, the w content of the sample causes a significant change in the dielectric constant of the solid, which is measured using bridge or frequency techniques. [Pg.169]

The electrical double layer resembles an ordinary (parallel-plate) capacitor. For an ideal capacitor, the charge (q) is directly proportional to the potential difference ... [Pg.20]

Figure 1-13 displays the experimental dependence of the double-layer capacitance upon the applied potential and electrolyte concentration. As expected for the parallel-plate model, the capacitance is nearly independent of the potential or concentration over several hundreds of millivolts. Nevertheless, a sharp dip in the capacitance is observed (around —0.5 V i.e., the Ep/C) with dilute solutions, reflecting the contribution of the diffuse layer. Comparison of the double layer witii die parallel-plate capacitor is dius most appropriate at high electrolyte concentrations (i.e., when C CH). [Pg.21]

Whatever the most acceptable model may be and as we need only a rough estimate of the amount of ions discharged, we start from the Helmholtz model of a simple parallel-plate capacitor, whose potential difference is... [Pg.44]

The electric field or ionic term corresponds to an ideal parallel-plate capacitor, with potential drop g (ion) = qMd/4ire. Itincludes a contribution from the polarizability of the electrolyte, since the dielectric constant is included in the expression. The distance d between the layers of charge is often taken to be from the outer Helmholtz plane (distance of closest approach of ions in solution to the metal in the absence of specific adsorption) to the position of the image charge in the metal a model for the metal is required to define this position properly. The capacitance per unit area of the ideal capacitor is a constant, e/Aird, often written as Klon. The contribution to 1/C is 1 /Klon this term is much less important in the sum (larger capacitance) than the other two contributions.2... [Pg.14]

The growth of an anodic alumina film, at a constant current, is characterized by a virtually linear increase of the electrode potential with time, exemplified by Fig. 10, with a more or less notable curvature (or an intercept of the extrapolated straight line) at the beginning of anodization.73 This reflects the constant rate of increase of the film thickness. Indeed, a linear relationship was found experimentally between the potential and the inverse capacitance78 (the latter reflecting the thickness in a model of a parallel-plate capacitor under the assumption of a constant dielectric permittivity). This is foreseen by applying Eq. (38) to Eq. (35). It is a consequence of the need for a constant electric field on the film in order to transport constant ionic current, as required by Eqs. (39)-(43). [Pg.424]

So the double-layer capacity is the same as that of a parallel-plate capacitor with the plate separation given by the Debye length. Since for high concentrations the latter are of the order of a few Angstroms, these capacities can be quite high. [Pg.23]

Method involves placing a specimen between parallel plate capacitors and applying a sinusoidal voltage (frequencies ranging from 1 mHz to 1 MHz) to one of the plates to establish an electric field in the specimen. In response to this field, a specimen becomes electrically polarized and can conduct a small charge from one plate to the other. Through measurement of the resultant current, the dielectric constant and dielectric loss constant for a specimen can be measured. The sharp increases in both the dielectric constant and the dielectric loss constant during a temperature scan are correlated with the occurrence of Tg... [Pg.75]

The electrified interface is generally referred to as the electric double layer (EDL). This name originates from the simple parallel plate capacitor model of the interface attributed to Helmholtz.1,9 In this model, the charge on the surface of the electrode is balanced by a plane of charge (in the form of nonspecifically adsorbed ions) equal in magnitude, but opposite in sign, in the solution. These ions have only a coulombic interaction with the electrode surface, and the plane they form is called the outer Helmholtz plane (OHP). Helmholtz s model assumes a linear variation of potential from the electrode to the OHP. The bulk solution begins immediately beyond the OHP and is constant in potential (see Fig. 1). [Pg.308]

The region between the surface plane and the IHP, and the region between the IHP and the OHP are considered to behave electrostatically as parallel plate capacitors, with charge related to potential by the capacitances C- and C2 ... [Pg.64]

The relationship between charge and potential are derived by assuming that the planes can be treated as plates of two parallel plate capacitors in series (18) with... [Pg.119]

Fig. 9.18 (a) Schematic of the device, which was designed for simultaneous measurement of the SWNT network capacitance and conductance, (b) Dependence of the network capacitance (red) and conductance (green) on the substrate voltage, FS. The network capacitance is approximately 1/4 the value of the capacitance for a parallel-plate capacitor with an equivalent area and oxide thickness (Kong et al., 2003. With the permission from American Chemical Society) (See Color Plates)... [Pg.199]

Thus, according to this model, the interphase consists of two equal and opposite layers of charges, one on the metal ( m) the other in solution (q ). This pair of charged layers, called the double layer, is equivalent to a parallel-plate capacitor (Fig. 4.5). The variation of potential in the double layer with distance from the electrode is linear (Fig. 4.4). A parallel-plate condenser has capacitance per unit area given by the equation... [Pg.44]

Figure 4.5. Electrical equivalent of the Helmholtz double layer a parallel-plate capacitor. Figure 4.5. Electrical equivalent of the Helmholtz double layer a parallel-plate capacitor.
In Section 4.3 it was shown that the electrical equivalent of the Helmholtz double layer is a parallel-plate capacitor (Fig. 4.5). In Section 4.5 (Fig. 4.9) it was shown that... [Pg.52]

Equation 6.3 is identical to the equation that relates the charge density, voltage difference, and distance of separation of a parallel-plate capacitor. This result indicates that a diffuse double layer at low potentials behaves like a parallel capacitor in which the separation distance between the plates is given by k. This explains why k is called the double layer thickness. [Pg.159]

LASL, Los Alamos, NM. The transducer described in his paper and shown in Fig 31 was in the form of an uncharged parallel-plate capacitor which had an explosive as a dielectric. One plate was connected to the signal input terminal of an oscilloscope, while the other plate was grounded and acted as part of the attenuator in the boosting system. When the shock wave in the grounded attenuator plate hir the explosive, a voltage appeared across the capacitor and a pulse appeared on the oscilloscope. Two oscilloscopes were used to record the waveform of the current in the transducer circuit which consisted of a small capacitance shunted by the small resistance of the signal cable. [Pg.340]

Figure 6.22 A parallel-plate capacitor (a) in vacuum and (b) with a dielectric material between the plates. Reprinted, by permission, from W. Callister, Materials Science and Engineering An Introduction, 5th ed., p. 640. Copyright 2000 by John Wiley Sons, Inc. Figure 6.22 A parallel-plate capacitor (a) in vacuum and (b) with a dielectric material between the plates. Reprinted, by permission, from W. Callister, Materials Science and Engineering An Introduction, 5th ed., p. 640. Copyright 2000 by John Wiley Sons, Inc.
Since Do is the surface charge density on the plate in vacuum, it can be related to the capacitance of a parallel plate capacitor in vacuum, Co, which is defined as... [Pg.564]


See other pages where Parallel-plate capacitor is mentioned: [Pg.1889]    [Pg.442]    [Pg.257]    [Pg.128]    [Pg.215]    [Pg.281]    [Pg.21]    [Pg.341]    [Pg.110]    [Pg.321]    [Pg.643]    [Pg.4]    [Pg.45]    [Pg.273]    [Pg.160]    [Pg.88]    [Pg.232]    [Pg.256]    [Pg.216]    [Pg.563]   
See also in sourсe #XX -- [ Pg.19 , Pg.21 , Pg.25 ]

See also in sourсe #XX -- [ Pg.391 ]




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