Blazed structure

An example from this laboratory demonstrates the photoelectrochernical etching of blazed structures. Crystals of n-GaAs (Nq = 5x1 O Vcm ) were cut and polished with (100), (100)-8° and (100)-18° orientations. The other parameters in Eq. 5 were n = 6, N = 500 and W = 2x1 O cm. The electrolyte composition was 0.1 M KCI, adjusted to pH 3, and the light intensity was 30 mW/cm . The potential was held at the onset of the photon limited region, 0.4 volt vs. SCE. Initial structures were etched under the assumption that the interior angles were 70.54°, as defined by the (ill) Ga surfaces. However, we found under closer examination that this angle was dependent on the etching conditions and on the electrolyte, and was closer to 90° under the present conditions. This would correspond most closely to the (223)Ga-rich surface. With a... 

Fig. 93 Profilometer scans of blazed grating structures ablated into polyimide. The profile shape depends on the corrections for the polymer response, i.e., etch rate per pulse at a given fluence. REPRINTED WITH PERMISSION OF [Ref. 322], COPYRIGHT (2001) Elsevier Science...

Ether e-thor [ME, fr. L aether, fr. Gk aither, fr. aithein to ignitem blaze akin to OE ad pyre] (14c) n. (1) Any organic compound in which an oxygen atom is interposed between two carbon atoms or organic radicals in the molecular structure. Ethers are often derived from alcohols by elimination... 

Figure 12.1 LC blazed-grating beam deflector by using a glass substrate with a sawtooth surface structure. PI polyimide ITO indium-tin-oxide PMMA poly(methyl-methacrylate).

F. Wyrowski, Diffractive optical elements iterative calculation of quantized, blazed phase structures. JOSA A 7(6), 961-969 (1990)... 

A trapezoidal intensity profile of the CS spectrum is generated resulting from the convolution process, induced by the small entrance and the wider intermediate slit. At each wavelength the broadness of the intensity profile can be filled to the detector dimension by motor-controlled adjustment of the intermediate slit width. The adequate profile position on the detector is permanently checked and, when necessary, shifted by prism rotation. Figure 3.7 shows an example of a typical continuum intensity profile. It is sloped due to the echelle blaze profile since Ihe aclual diffraction angle differs from the blaze maximum. The contour of the sharp Hg absorption line at 253.652 nm is located in the middle of the profile symmetrical to the center pixel, often surrounded by additional atomic lines or molecular structures. Based on this simultaneously detected spectrum interval the unique HR-CS AAS background correction algorithm is applied as described in detail in Section 5.2. 

---