Back scattering measurement

The goal of URT is to obtain reflectivity images from back-scattered measurements. This consists in a Fourier synthesis problem, and the first task is to correctly cover the frequency space of the "object" r. Let for simplicity the dimension of the physical space be 2. 

These samples were measured non-destructively by energy-dispersive XRF with synclirotron radiation excitation (SYXRS), by g-XRF, by wavelength-dispersive XRF (WDXRS), and by Rutherford back scattering (RBS), by X-ray reflectometry (XRR) and by destructive secondary ion mass spectrometry (SIMS) as well (both last methods were used for independant comparison). 

One of the most fascinating applications of channeling RBS is the study of lattice locations of impurity atoms. By measuring the angular dependence of the back-scattering yield of the impurity and host atoms around three independent channeling axes it is possible to calculate the position of the impurity. Details can be found elsewhere [3.122]. 

As is apparent from Eq. (3.34), the back-scattered ion-yield in LEIS is a measure of the concentration of an element in the surface, if the other quantities are known. 

Practically it is more convenient to measure intensity ratios instead of absolute intensities. Thus, e.g., Cu may serve as a reference material, relative to which the ion intensities back-scattered from the atoms of the surface under consideration are measured ... 

Direct Measurement of HO, in the Troposphere. Techniques to measure tropospheric concentrations of HO have been reviewed (O Brien Hard, submitted to Advances in Chemistry, 1991) so only a summary will be given here. The most extensively researched technique for [HO ] measurement in the troposphere is based on laser-induced fluorescence (LIF) of HO. This approach has been developed in many configurations directing the laser into the free atmosphere and collecting fluorescence back scatter (LIDAR) (105,106,107) LIF of air sampled at atmospheric pressure... 

Figure 7.3 shows the two-beam photon-force measurement system using a coaxial illumination photon force measurement system. Two microparticles dispersed in a liquid are optically trapped by two focused near-infrared beams ( 1 pm spot size) of a CW Nd YAG laser under an optical microscope (1064 nm, 1.2 MWcm , lOOX oil-immersion objective, NA = 1.4). The particles are positioned sufficiently far from the surface of a glass slide in order to neglect the interaction between the particles and the substrate. Green and red beams from a green LD laser (532 nm, 21 kWcm ) and a He-Ne laser (632.8 nm, 21 kW cm ) are introduced coaxially into the microscope and slightly focused onto each microparticle as an illumination light (the irradiated area was about 3 pm in diameter). The sizes of the illumination areas for the green and red beams are almost the same as the diameter of the microparticles (see Figure 7.4). The back scattered light from the surface of each microparticle is...

In Raman measurements [57], the 514-nm line of an Ar+ laser, the 325-nm line of a He-Cd laser, and the 244-nm line of an intracavity frequency-doubled Ar+ laser were employed. The incident laser beam was directed onto the sample surface under the back-scattering geometry, and the samples were kept at room temperature. In the 514-nm excitation, the scattered light was collected and dispersed in a SPEX 1403 double monochromator and detected with a photomultiplier. The laser output power was 300 mW. In the 325- and 244-nm excitations, the scattered light was collected with fused silica optics and was analyzed with a UV-enhanced CCD camera, using a Renishaw micro-Raman system 1000 spectrometer modified for use at 325 and 244 nm, respectively. A laser output of 10 mW was used, which resulted in an incident power at the sample of approximately 1.5 mW. The spectral resolution was approximately 2 cm k That no photoalteration of the samples occurred during the UV laser irradiation was ensured by confirming that the visible Raman spectra were unaltered after the UV Raman measurements. 

Conversion electron Mossbauer spectroscopy (CEMS) measurements with back scattering geometry have the merit that spectra can be obtained from a sample with much less isotope content compared with transmission measurements. Another merit is that a sample, deposited on a thick substrate, could be measured, and that because of the limited escape depth of the conversion electrons, depth-selective surface studies are possible. The CEMS technique was found to be best applicable to specimens of 10-100 pg Au cm, i.e., about two orders of magnitudes thinner than required for measurements in transmission mode [443]. This way (1) very thin films of gold alloys, as well as laser- and in beam-modified surfaces in the submicrometers range of depth [443], and (2) metallic gold precipitates in implanted MgO crystals [444] were investigated. 

Consequently, we will follow the example of Mills et al. (29) who recently presented the first measurements of local solvent concentration using the Rutherford back-scattering technique. They analyzed the case of 1,1,1-trichloroethane (TCE) diffusing into PMMA films in terms of a simpler model developed by Peterlin 130-311, in which the propagating solvent front is preceded by a Fickian precursor. The Peterlin model describes the front end of the steady state SCP as ... 

Figure 1.4 Comparison of the application ranges of techniques that are sensitive to nearsurface strains. Minimum detection limits are plotted against depth resolution of the measurement. XRD X-ray diffraction DOR differential optical reflectometry. RBS Rutherford back scattering MEIS medium energy ion scattering TEM transmission electron microscopy...

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